Dr. Dimitrios Kazazis
Scientist at Paul Scherrer Institute
SPIE Involvement:
Author
Publications (51)

SPIE Journal Paper | 11 July 2024
Xiaodong Yuan, Jinping Chen, Tianjun Yu, Yi Zeng, Xudong Guo, Shuangqing Wang, Rui Hu, Peng Tian, Michaela Vockenhuber, Dimitrios Kazazis, Yasin Ekinci, Jun Zhao, Yanqing Wu, Guoqiang Yang, Yi Li
JM3, Vol. 23, Issue 03, 034601, (July 2024) https://doi.org/10.1117/12.10.1117/1.JMM.23.3.034601
KEYWORDS: Extreme ultraviolet lithography, Electron beam lithography, Lithography, Line edge roughness, Film thickness, Etching, Scanning electron microscopy, Solubility, Line width roughness, Molecules

Proceedings Article | 10 April 2024 Presentation
Myung Mo Sung, Hyeonseok Ji, Jaehyuk Lee, Jinho Ahn, Chang Gyoun Kim, Sangsul Lee, Yasin Ekinci, Prajith Karadan, Dimitrios Kazazis
Proceedings Volume PC12953, PC129530K (2024) https://doi.org/10.1117/12.3009753
KEYWORDS: Extreme ultraviolet lithography, Extreme ultraviolet, Photoresist materials, Line width roughness, Synchrotron radiation, Monolayers, Solubility, Resistance, Reproducibility, Outgassing

Proceedings Article | 10 April 2024 Presentation
Proceedings Volume PC12953, PC129530P (2024) https://doi.org/10.1117/12.3010388
KEYWORDS: Extreme ultraviolet lithography, Extreme ultraviolet, Mirrors, Electron beam lithography, Diffraction gratings, Diffraction, Photoresist materials, Lithography, Synchrotrons, Reflection

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12955, 129552Y (2024) https://doi.org/10.1117/12.3010514
KEYWORDS: Image restoration, Temporal coherence, Extreme ultraviolet, Light sources and illumination, Image quality, Diffraction, Optical coherence, Scanning electron microscopy, Reconstruction algorithms, Photomasks

Proceedings Article | 9 April 2024 Presentation + Paper
Luong Nguyen Dang, Li-Ting Tseng, Anil Rajak, Thomas Gädda, Markus Laukkanen, Jagadish Salunke, Shima Moosakkani, Jyri Paulasaari, Juha Rantala, Michaela Vockenhuber, Dimitrios Kazazis, Yasin Ekinci
Proceedings Volume 12957, 129570I (2024) https://doi.org/10.1117/12.3014297
KEYWORDS: Electron beam lithography, Solubility, Extreme ultraviolet, Extreme ultraviolet lithography, Silicon, Polymers, Line width roughness, Photoresist materials, Lithography, Spin on carbon materials

Showing 5 of 51 publications
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