Dr. Vyshnavi Suntharalingam Profile

Dr. Vyshnavi Suntharalingam

Principal Staff at MIT Lincoln Laboratory

SPIE Involvement:

Author

Publications (18)

SPIE Journal Paper | 26 May 2022

First results on SiSeRO devices: a new x-ray detector for scientific instrumentation

Tanmoy Chattopadhyay, Sven Herrmann, Barry Burke, Kevan Donlon, Gregory Prigozhin, Glenn Morris, Peter Orel, Michael Cooper, Andrew Malonis, Daniel R. Wilkins, Vyshnavi Suntharalingam, Steven Allen, Marshall Bautz, Chris Leitz

JATIS, Vol. 8, Issue 02, 026006, (May 2022) https://doi.org/10.1117/12.10.1117/1.JATIS.8.2.026006

KEYWORDS: Sensors, Transistors, Charge-coupled devices, Amplifiers, X-ray detectors, X-rays, Prototyping, Analog electronics, Field effect transistors, Clocks

Read Abstract +

SPIE Journal Paper | 20 May 2019 Open Access

Open Access

Toward fast, low-noise charge-coupled devices for Lynx

Marshall Bautz, Barry Burke, Michael Cooper, David Craig, Richard Foster, Catherine Grant, Beverly LaMarr, Christopher Leitz, Andrew Malonis, Eric Miller, Gregory Prigozhin, Daniel Schuette, Vyshnavi Suntharalingam, Carolyn Thayer

JATIS, Vol. 5, Issue 02, 021015, (May 2019) https://doi.org/10.1117/12.10.1117/1.JATIS.5.2.021015

KEYWORDS: Sensors, Charge-coupled devices, X-rays, Clocks, Electrons, Amplifiers, Spectral resolution, Silicon, X-ray detectors, Tolerancing

Read Abstract +

Lynx requires large-format x-ray imaging detectors with performance at least as good as the best current-generation devices but with much higher readout rates. We are investigating an advanced charge-coupled device (CCD) detector architecture under development at MIT Lincoln Laboratory for use in the Lynx high-definition x-ray imager and x-ray grating spectrometer instruments. This architecture features a CMOS-compatible detector integrated with parallel CMOS signal processing chains. Fast, low-noise amplifiers and highly parallel signal processing provide the high frame rates required. CMOS-compatibility of the CCD enables low-power charge transfer and signal processing. We report on the performance of CMOS-compatible test CCDs read at pixel rates up to 5.0 Mpix s − 1 (50 times faster than Chandra ACIS CCDs), with transfer clock swings as low as 1.0-V peak-to-peak (power/gate-area comparable to ACIS CCDs at 100 times the parallel transfer rate). We measure read noise of 4.6 electrons RMS at 2.5 MHz and x-ray spectral resolution better than 150-eV full-width at half maximum at 5.9 keV for single-pixel events. We report charge transfer efficiency measurements and demonstrate that buried channel trough implants as narrow as 0.8 μm are effective in improving charge transfer performance. We find that the charge transfer efficiency of these devices drops significantly as detector temperature is reduced from ∼ − 30 ° C to −60 ° C. We point out the potential of previously demonstrated curved-detector fabrication technology for simplifying the design of the Lynx high-definition imager. We discuss the expected detector radiation tolerance at these relatively high transfer rates. Finally, we note that the high pixel “aspect ratio” (depletion depth: pixel size ≈9 ∶ 1) of our test devices is similar to that expected for Lynx detectors and discuss implications of this geometry for x-ray performance and noise requirements.

Proceedings Article | 18 September 2018 Presentation + Paper

Presentation + Paper

Large-format image sensors based on custom Geiger-mode avalanche photodiode arrays

Brian Aull, Erik Duerr, Jonathan Frechette, K. Alexander McIntosh, Daniel Schuette, Vyshi Suntharalingam, Richard Younger

Proceedings Volume 10729, 107290B (2018) https://doi.org/10.1117/12.2322656

KEYWORDS: Avalanche photodetectors, Silicon, Sensors, LIDAR, Semiconducting wafers, Image sensors, Image processing, Imaging systems, Wafer bonding, Avalanche photodiodes

Read Abstract +

Proceedings Article | 6 July 2018 Presentation + Paper

Presentation + Paper

Development of germanium charge-coupled devices

C. Leitz, M. Zhu, S. Rabe, B. Burke, I. Prigozhin, D. O'Mara, K. Ryu, M. Cooper, R. Reich, K. Johnson, W. Hu, B. Felton, M. Cook, C. Stull, V. Suntharalingam

Proceedings Volume 10709, 1070908 (2018) https://doi.org/10.1117/12.2310120

KEYWORDS: Charge-coupled devices, Germanium, X-rays, X-ray detectors

Read Abstract +

Proceedings Article | 6 July 2018 Paper

Paper

Oxide-bonded molecular-beam epitaxial backside passivation process for large-format CCDs

K. Ryu, C. Leitz, H. Clark, X. Chen, M. Cooper, M. Zhu, P. Welander, R. Lambert, V. Bolkhovsky, D.-R. Yost, B. Burke, J. Gregory, V. Suntharalingam

Proceedings Volume 10699, 106993P (2018) https://doi.org/10.1117/12.2311512

KEYWORDS: Semiconducting wafers, Charge-coupled devices, Hydrogen, Oxides, Silicon, Quantum efficiency, Wafer bonding, Ultraviolet radiation, Interfaces, Plasma enhanced chemical vapor deposition, Molecular beam epitaxy

Read Abstract +

Proceedings Article | 6 July 2018 Presentation + Paper

Presentation + Paper

Toward fast low-noise low-power digital CCDs for Lynx and other high-energy astrophysics missions

M. Bautz, R. Foster, B. LaMarr, A. Malonis, G. Prigozhin, E. Miller, C. Grant, B. Burke, M. Cooper, D. Craig, C. Leitz, D. Schuette, V. Suntharalingam

Proceedings Volume 10699, 1069917 (2018) https://doi.org/10.1117/12.2313594

KEYWORDS: Charge-coupled devices, Sensors, Amplifiers, X-rays, Clocks, CCD image sensors, Spectral resolution, Silicon

Read Abstract +

SPIE Journal Paper | 28 June 2017

Directly deposited optical-blocking filters for single-photon x-ray imaging spectroscopy

Kevin Ryu, Marshall Bautz, Steven Kissel, Peter O'Brien, Vyshnavi Suntharalingam

JATIS, Vol. 3, Issue 03, 036001, (June 2017) https://doi.org/10.1117/12.10.1117/1.JATIS.3.3.036001

KEYWORDS: Optical filters, X-ray imaging, Imaging spectroscopy, Charge-coupled devices, Spectroscopy, Image filtering, Spectroscopes, X-ray optics, X-rays, Transmittance

Read Abstract +

Proceedings Article | 29 July 2016 Paper

Paper

Testing and characterization of the TESS CCDs

C. Thayer, J. Villasenor, S. Kissel, B. LaMarr, E. Morgan, G. Prigozhin, I. Prigozhin, G. Ricker, T. Sauerwein, V. Suntharalingam, R. Vanderspek, D. Woods

Proceedings Volume 9904, 99042X (2016) https://doi.org/10.1117/12.2232886

KEYWORDS: Charge-coupled devices, Sensors, Cameras, Stars, Electronics, X-rays, Light emitting diodes, Imaging arrays, Floods, Temperature metrology

Read Abstract +

Proceedings Article | 29 July 2016 Paper

Paper

The TESS camera: modeling and measurements with deep depletion devices

Deborah Woods, Roland Vanderspek, Robert MacDonald, Edward Morgan, Joel Villasenor, Carolyn Thayer, Barry Burke, Christian Chesbrough, Michael Chrisp, Kristin Clark, Gabor Furesz, Alexandria Gonzales, Tam Nguyen, Gregory Prigozhin, Brian Primeau, George Ricker, Timothy Sauerwein, Vyshnavi Suntharalingam

Proceedings Volume 9904, 99042C (2016) https://doi.org/10.1117/12.2231296

KEYWORDS: Instrument modeling, Zemax, Sensors, Cameras, Monte Carlo methods, Silicon, Zemax, Charge-coupled devices, Photons, Diffusion, Point spread functions

Read Abstract +

Proceedings Article | 18 July 2016 Paper

Paper

Directly-deposited blocking filters for high-performance silicon x-ray detectors

M. Bautz, S. Kissel, R. Masterson, K. Ryu, V. Suntharalingam

Proceedings Volume 9905, 99054C (2016) https://doi.org/10.1117/12.2232905

KEYWORDS: X-rays, Charge-coupled devices, Contamination, Calibration, Absorption, Neon, Data modeling, Space operations, Mirrors, Optical filters

Read Abstract +

SPIE Journal Paper | 11 September 2015 Open Access

Open Access

Enhancing the far-ultraviolet sensitivity of silicon complementary metal oxide semiconductor imaging arrays

Kurt Retherford, Yibin Bai, Kevin Ryu, James Gregory, Paul Welander, Michael Davis, Thomas Greathouse, Gregory Winters, Vyshnavi Suntharalingam, James Beletic

JATIS, Vol. 1, Issue 04, 046001, (September 2015) https://doi.org/10.1117/12.10.1117/1.JATIS.1.4.046001

KEYWORDS: Silicon, Semiconducting wafers, Ultraviolet radiation, Sensors, Oxides, Quantum efficiency, Doping, CMOS technology, Imaging arrays, Antimony

Read Abstract +

Proceedings Article | 24 July 2014 Paper

Paper

Development of CCDs for REXIS on OSIRIS-REx

Kevin Ryu, Barry Burke, Harry Clark, Renee Lambert, Peter O'Brien, Vyshnavi Suntharalingam, Christopher Ward, Keith Warner, Mark Bautz, Richard Binzel, Steven Kissel, Rebecca Masterson

Proceedings Volume 9144, 91444O (2014) https://doi.org/10.1117/12.2055260

KEYWORDS: Charge-coupled devices, X-rays, Aluminum, Silicon, Semiconducting wafers, X-ray imaging, Imaging systems, Absorption, Asteroids, Spectral resolution

Read Abstract +

Proceedings Article | 23 July 2014 Paper

Paper

Enhancing the far-UV sensitivity of silicon CMOS imaging arrays

K. Retherford, Yibin Bai, Kevin Ryu, J. Gregory, Paul Welander, Michael Davis, Thomas Greathouse, Gregory Winter, Vyshnavi Suntharalingam, James Beletic

Proceedings Volume 9154, 915412 (2014) https://doi.org/10.1117/12.2054840

KEYWORDS: Silicon, Semiconducting wafers, Sensors, Ultraviolet radiation, Doping, Oxides, Quantum efficiency, CMOS sensors, Antimony, CMOS devices

Read Abstract +

Proceedings Article | 14 September 2011 Paper

Paper

Radiation testing of mini-orthogonal transfer array CCDs

Beverly LaMarr, Mark Bautz, Steve Kissel, Gregory Prigozhin, Barry Burke, Michael Cooper, Vyshnavi Suntharalingam

Proceedings Volume 8145, 81450M (2011) https://doi.org/10.1117/12.893810

KEYWORDS: X-rays, Charge-coupled devices, X-ray astronomy, Temperature metrology, Staring arrays, Space telescopes, Spectral resolution, Error analysis, X-ray detectors, Astrophysics

Read Abstract +

Proceedings Article | 20 July 2010 Paper

Paper

Interpixel crosstalk in a 3D-integrated active pixel sensor for x-ray detection

Beverly LaMarr, Mark Bautz, Rick Foster, Steve Kissel, Gregory Prigozhin, Vyshnavi Suntharalingam

Proceedings Volume 7742, 77422B (2010) https://doi.org/10.1117/12.857137

KEYWORDS: X-rays, Sensors, X-ray detectors, Active sensors, Silicon, Manganese, X-ray imaging, Astrophysics, Diodes, Photon counting

Read Abstract +

Proceedings Article | 20 July 2010 Paper

Paper

Measurement results for an x-ray 3D-integrated active pixel sensor

G. Prigozhin, R. Foster, V. Suntharalingam, S. Kissel, B. LaMarr, M. Bautz

Proceedings Volume 7742, 77421I (2010) https://doi.org/10.1117/12.857652

KEYWORDS: Capacitance, X-rays, Photodiodes, Sensors, Diodes, Transistors, X-ray detectors, Active sensors, Switching, Silicon

Read Abstract +

Proceedings Article | 17 September 2007 Paper

Paper

Back-illuminated three-dimensionally integrated CMOS image sensors for scientific applications

Vyshnavi Suntharalingam, Dennis Rathman, Gregory Prigozhin, Steven Kissel, Mark Bautz

Proceedings Volume 6690, 669009 (2007) https://doi.org/10.1117/12.739807

KEYWORDS: Transistors, Sensors, Imaging systems, Back illuminated sensors, Charge-coupled devices, Silicon, Semiconducting wafers, Image sensors, Photodiodes, CMOS sensors

Read Abstract +

Proceedings Article | 15 May 2000 Paper

Paper

Merged CCD/SOI-CMOS technology

Vyshi Suntharalingam, Barry Burke, J. Burns, M. Cooper, Craig Keast

Proceedings Volume 3965, (2000) https://doi.org/10.1117/12.385466

KEYWORDS: Charge-coupled devices, Imaging systems, Semiconducting wafers, Silicon, Oscillators, Scanning electron microscopy, Image processing, CMOS technology, Imaging devices

Read Abstract +

Showing 5 of 18 publications

SIGN IN TO:

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Advertisement

Advertisement