Mr. Torsten Machleidt Profile

Torsten Machleidt

Research Associate at Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH

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Publications (6)

Proceedings Article | 15 August 2023 Presentation + Paper

Accelerated measurement and defect characterization on large optical components

Matthias Liedmann, Torsten Machleidt

Proceedings Volume 12618, 126181S (2023) https://doi.org/10.1117/12.2673089

KEYWORDS: Profilometers, 3D scanning, 3D metrology, Surface roughness, Defect inspection, Sensors, Data processing, Interferometry

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Proceedings Article | 13 May 2013 Paper

Measurement, visualization and analysis of extremely large data sets with a nanopositioning and nanomeasuring machine

O. Birli, K.-H. Franke, G. Linß, T. Machleidt, E. Manske, F. Schale, H.-C. Schwannecke, E. Sparrer, M. Weiß

Proceedings Volume 8788, 87880X (2013) https://doi.org/10.1117/12.2020538

KEYWORDS: Visualization, Sensors, Data conversion, Image filtering, Zoom lenses, Blob detection, Calibration, Binary data, Image processing, Detection and tracking algorithms

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Proceedings Article | 27 May 2011 Paper

Multisensor technology based on a laser focus probe for nanomeasuring applications over large areas

Eberhard Manske, Gerd Jäger, Tino Hausotte, Torsten Machleidt

Proceedings Volume 8082, 808203 (2011) https://doi.org/10.1117/12.888445

KEYWORDS: Sensors, Laser beam diagnostics, Microscopes, Objectives, Atomic force microscopy, CCD cameras, Laser applications, Collimators, Nanostructures, Metrology

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Proceedings Article | 13 May 2011 Paper

Integration of CMM software standards for nanopositioning and nanomeasuring machines

E. Sparrer, T. Machleidt, T. Hausotte, E. Manske, K.-H. Franke

Proceedings Volume 8031, 80312G (2011) https://doi.org/10.1117/12.882822

KEYWORDS: Human-machine interfaces, Metrology, Data processing, Inspection, Computer programming, Computer architecture, Calibration, MATLAB, Sensors, Measurement devices

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Proceedings Article | 22 May 2009 Paper

Kelvin probe force microscopy: measurement data reconstruction

Torsten Machleidt, Erik Sparrer, Tim Kubertschak, Rico Nestler, Karl-Heinz Franke

Proceedings Volume 7378, 73781C (2009) https://doi.org/10.1117/12.821787

KEYWORDS: Point spread functions, Deconvolution, Scanning probe microscopy, Microscopy, Convolution, Microscopes, Data modeling, Chemical elements, Image processing, Analytical research

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Proceedings Article | 18 June 2007 Paper

White light interferometry in combination with a nanopositioning and nanomeasuring machine (NPMM)

Daniel Kapusi, Torsten Machleidt, Karl-Heinz Franke, Rainer Jahn

Proceedings Volume 6616, 661607 (2007) https://doi.org/10.1117/12.726114

KEYWORDS: Optical interferometry, Cameras, Light sources, Standards development, Time metrology, 3D imaging standards, Sensors, Visualization, 3D metrology, Environmental sensing

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Showing 5 of 6 publications

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