Dr. James S. Harris Profile

Dr. James S. Harris

Retired

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 24 April 2010 Paper

SPITFIRE multi-band short-wave and mid-wave polarimetric camera

Hiren Patel, Robert Mack, Daniel LeMaster, James Harris, David Forrai, Jan Servaites

Proceedings Volume 7672, 767207 (2010) https://doi.org/10.1117/12.851510

KEYWORDS: Staring arrays, Cameras, Polarimetry, Optical filters, Sensors, Mid-IR, Polarizers, Electronics, Short wave infrared radiation, Polarization

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Proceedings Article | 30 April 2008 Paper

Wiregrid micro-polarizers for mid-infrared applications

Andrew Sarangan, Aziz Mahfoud, Zhi Wu, Qiwen Zhan, David Forrai, Darrel Endres, John Devitt, Robert Mack, James Harris

Proceedings Volume 6959, 695915 (2008) https://doi.org/10.1117/12.778028

KEYWORDS: Silicon, Metals, Lithography, Silica, Mid-IR, Aluminum, Staring arrays, Deep ultraviolet, Polarization, Polarizers

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Proceedings Article | 12 September 2007 Paper

Development of a MWIR polarimetric FPA

David Forrai, Darrel Endres, John Devitt, Andrew Sarangan, Qiwen Zhan, Aziz Mahfoud-Familia, Robert Mack, James Harris

Proceedings Volume 6660, 666007 (2007) https://doi.org/10.1117/12.737777

KEYWORDS: Staring arrays, Polarimetry, Mid-IR, Sensors, Optical filters, Semiconducting wafers, Cameras, Metals, Deep ultraviolet, Short wave infrared radiation

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Proceedings Article | 29 December 1998 Paper

Birefringent torque sensor for motors

Dukki Chung, Francis Merat, Fred Discenzo, James Harris

Proceedings Volume 3520, (1998) https://doi.org/10.1117/12.334339

KEYWORDS: Sensors, Neural networks, Photoelasticity, Fringe analysis, Image sensors, Image processing, Error analysis, Polarizers, Light sources, Cameras

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Proceedings Article | 31 October 1996 Paper

Optical system for real-time web-process defect inspection

James Harris

Proceedings Volume 2908, (1996) https://doi.org/10.1117/12.257267

KEYWORDS: LCDs, Neural networks, Chemical elements, Defect inspection, Inspection, Optical components, Light scattering, Optical scanning, Detector arrays, Evolutionary algorithms

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Proceedings Volume Editor (1)

SPIE Conference Volume | 29 December 1998

Three-Dimensional Imaging, Optical Metrology, and Inspection IV

Conference Committee Involvement (1)

Three-Dimensional Imaging, Optical Metrology, and Inspection IV

2 November 1998 | Boston, MA, United States

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