Mr. David Forrai Profile

David Forrai

EO/IR Engineer at Leidos

SPIE Involvement:

Author

Publications (22)

Proceedings Article | 21 June 2018 Presentation + Paper

Transitioning large-diameter Type II Superlattice detector wafers to manufacturing

David Forrai, Robert Jones, Michael Garter, Yajun Wei, Steven Allen, Laura Couch

Proceedings Volume 10624, 106240L (2018) https://doi.org/10.1117/12.2311515

KEYWORDS: Sensors, Semiconducting wafers, Manufacturing, Superlattices, Infrared sensors, Sensor technology, Epitaxy, Heterojunctions, Staring arrays, Group III-V semiconductors

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The tri-service Vital Infrared Sensor Technology Acceleration (VISTA) program rapidly matured III-V semiconductor epitaxy to produce tactically viable detectors using Type II Superlattice (T2SL) structures. The T2SL material system allows tunable band gaps for creating lattice-matched heterojunction devices. Heterojunction devices are integral to suppressing sources of dark currents, such as internal Shockley Reed Hall (SRH) and device surface currents. Once the VISTA program demonstrated that T2SL detectors offered competitive performance to traditional indium antimonide (InSb) detectors at an operating temperature 40K to 50 K higher, many opportunities emerged. This elevation in operating temperature provides two benefits to infrared (IR) sensors. The first is to miniaturize the integrated Dewar-electronicscooler assembly (IDECA) such that it can support small aerial vehicle and soldier mounted sensors. The second is to increase the mean time to failure (MTTF) of an existing InSb IDECA. To benefit from T2SL higher operating temperature (HOT) detectors, the overall cost of the IDECA must be competitive with InSb. This drives a manufacturing capability that is equivalent to InSb. At the L3 Space and Sensors Technology Center (L3 SSTC), the III-V detector foundry processes 125 mm diameter InSb wafers. The development of 125 mm diameter T2SL detector wafers started with the gallium antimonide substrates. The greater size and weight of these substrates required extra care to avoid breakage. Leveraging the learning reported from the silicon industry, we developed a specification for the substrate thickness and edge bevel to provide a robust platform for wafer processing. Next, we worked with commercial III-V epitaxy suppliers to develop multi-wafer growth capability for 125 mm diameter substrates. The results of this effort, funded by the Office of the Secretary of Defense (OSD) Defense-wide Manufacturing Science and Technology (DMST) program through the Army Night Vision and Electronic Sensor Directorate (NVESD), we were able to improve focal plane array (FPA) yield from virtually zero to InSb manufacturing levels.

Proceedings Article | 21 June 2017 Presentation

Implementing VISTA technology in a III-V detector foundry (Conference Presentation)

Dave Forrai

Proceedings Volume 10177, 101770X (2017) https://doi.org/10.1117/12.2266308

KEYWORDS: Sensors, Infrared sensors, Electronics, Cryogenics, Infrared technology, Current controlled current source

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Proceedings Article | 21 January 2012 Paper

Electromagnetic design of resonator-QWIPs

K. K. Choi, M. Jhabvala, D. Forrai, A. Waczynaski, J. Sun, R. Jones

Proceedings Volume 8268, 82682O (2012) https://doi.org/10.1117/12.903605

KEYWORDS: Quantum efficiency, Sensors, Quantum well infrared photodetectors, Absorption, Data modeling, 3D modeling, Infrared radiation, Electromagnetism, Staring arrays, Diffraction gratings

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SPIE Journal Paper | 1 June 2011

Corrugated quantum well infrared photodetectors for far infrared detection

Kwong-Kit Choi, Jason Sun, Merzy Jhabvala, David Forrai, Darrel Endres

OE, Vol. 50, Issue 06, 061005, (June 2011) https://doi.org/10.1117/12.10.1117/1.3578406

KEYWORDS: Staring arrays, Sensors, Quantum well infrared photodetectors, Far infrared, Quantum wells, Electrons, Infrared sensors, Doping, Absorption, Quantum efficiency

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Proceedings Article | 21 May 2011 Paper

Electromagnetic modeling of QWIP FPA pixels

K. Choi, M. Jhabvala, D. Forrai, A. Waczynski, J. Sun, R. Jones

Proceedings Volume 8012, 80120R (2011) https://doi.org/10.1117/12.883456

KEYWORDS: Quantum efficiency, Sensors, Quantum well infrared photodetectors, Staring arrays, Antireflective coatings, Data modeling, 3D modeling, Resonators, Autoregressive models, Absorption

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Proceedings Article | 5 May 2010 Paper

Advances in IR thermal imaging for border defense

D. Forrai, P. Smith

Proceedings Volume 7666, 76661Y (2010) https://doi.org/10.1117/12.846281

KEYWORDS: Sensors, Cameras, Imaging systems, Thermography, Infrared imaging, Cerium, Video, Infrared sensors, Staring arrays, Image enhancement

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Proceedings Article | 4 May 2010 Paper

C-QWIPs for far infrared detection

K. Choi, M. Jhabvala, D. Forrai, J. Sun, D. Endres

Proceedings Volume 7660, 76603K (2010) https://doi.org/10.1117/12.849715

KEYWORDS: Staring arrays, Sensors, Quantum wells, Far infrared, Quantum well infrared photodetectors, Absorption, Electrons, Quantum efficiency, Infrared sensors, Doping

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Proceedings Article | 24 April 2010 Paper

SPITFIRE multi-band short-wave and mid-wave polarimetric camera

Hiren Patel, Robert Mack, Daniel LeMaster, James Harris, David Forrai, Jan Servaites

Proceedings Volume 7672, 767207 (2010) https://doi.org/10.1117/12.851510

KEYWORDS: Staring arrays, Cameras, Polarimetry, Optical filters, Sensors, Mid-IR, Polarizers, Electronics, Short wave infrared radiation, Polarization

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Proceedings Article | 7 May 2009 Paper

C-QWIP focal plane array sensitivity

K. Choi, D. Forrai, D. Endres, J. Sun, P. Pinsukanjana, J. Devitt

Proceedings Volume 7298, 729807 (2009) https://doi.org/10.1117/12.816617

KEYWORDS: Sensors, Staring arrays, Quantum wells, Quantum efficiency, Doping, Readout integrated circuits, Quantum well infrared photodetectors, Electrons, Performance modeling, Neodymium

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Proceedings Article | 3 September 2008 Paper

C-QWIP focal plane array development

K. Choi, D. Forrai, D. Endres, J. Sun, P. Pinsukanjana, J. Devitt

Proceedings Volume 7082, 708208 (2008) https://doi.org/10.1117/12.792556

KEYWORDS: Staring arrays, Quantum efficiency, Sensors, Absorption, Quantum wells, Readout integrated circuits, Quantum well infrared photodetectors, Doping, Neodymium, Black bodies

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Proceedings Article | 30 April 2008 Paper

Wiregrid micro-polarizers for mid-infrared applications

Andrew Sarangan, Aziz Mahfoud, Zhi Wu, Qiwen Zhan, David Forrai, Darrel Endres, John Devitt, Robert Mack, James Harris

Proceedings Volume 6959, 695915 (2008) https://doi.org/10.1117/12.778028

KEYWORDS: Silicon, Metals, Lithography, Silica, Mid-IR, Aluminum, Staring arrays, Deep ultraviolet, Polarization, Polarizers

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Proceedings Article | 12 September 2007 Paper

Corrugated QWIP developments for tactical infrared imaging

David Forrai, Kwong-Kit Choi, John Devitt

Proceedings Volume 6660, 666010 (2007) https://doi.org/10.1117/12.740311

KEYWORDS: Sensors, Long wavelength infrared, Quantum efficiency, Quantum well infrared photodetectors, Staring arrays, Semiconducting wafers, Mid-IR, Quantum wells, Absorption, Readout integrated circuits

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Proceedings Article | 12 September 2007 Paper

Development of a MWIR polarimetric FPA

David Forrai, Darrel Endres, John Devitt, Andrew Sarangan, Qiwen Zhan, Aziz Mahfoud-Familia, Robert Mack, James Harris

Proceedings Volume 6660, 666007 (2007) https://doi.org/10.1117/12.737777

KEYWORDS: Staring arrays, Polarimetry, Mid-IR, Sensors, Optical filters, Semiconducting wafers, Cameras, Metals, Deep ultraviolet, Short wave infrared radiation

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Proceedings Article | 8 June 2007 Paper

Development of a 1 megapixel long IR QWIP focal plane array

M. Jhabvala, K. K. Choi, C. Monroy, A. La, J. Adams, J. Devitt, D. Forrai, D. Endres

Proceedings Volume 6542, 65420T (2007) https://doi.org/10.1117/12.717224

KEYWORDS: Quantum well infrared photodetectors, Gallium arsenide, Staring arrays, Electronics, Imaging systems, Cameras, Sensors, Quantum efficiency, Readout integrated circuits, Semiconducting wafers

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Proceedings Article | 14 May 2007 Paper

C-QWIP material design and growth

K. K. Choi, J. Devitt, D. Forrai, D. Endres, J. Marquis, J. Bettge, P. Pinsukanjana

Proceedings Volume 6542, 65420S (2007) https://doi.org/10.1117/12.718780

KEYWORDS: Sensors, Staring arrays, Quantum efficiency, Semiconducting wafers, Doping, Quantum well infrared photodetectors, Absorption, Quantum wells, Photons, Neodymium

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Proceedings Article | 30 April 2007 Paper

Characterization of a C-QWIP LWIR camera

David Forrai, Mark Sempsrott, Robert Fischer, Kwong-Kit Choi, John Devitt

Proceedings Volume 6543, 654317 (2007) https://doi.org/10.1117/12.719255

KEYWORDS: Cameras, Staring arrays, Sensors, Long wavelength infrared, Electronics, Readout integrated circuits, Imaging systems, Temperature metrology, Modulation transfer functions, Quantum efficiency

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Proceedings Article | 17 May 2006 Paper

Optimization of corrugated-QWIPs for large format, high-quantum efficiency, and multicolor FPAs

Kwong-Kit Choi, Carlos Monroy, Venkataraman Swaminathan, Theodor Tamir, Ming Leung, John Devitt, David Forrai, Darrel Endres

Proceedings Volume 6206, 62060B (2006) https://doi.org/10.1117/12.663960

KEYWORDS: Sensors, Electrons, Quantum efficiency, Staring arrays, Medium wave, Quantum well infrared photodetectors, Gold, Metals, Refractive index, Stereolithography

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Proceedings Article | 17 May 2006 Paper

Uncooled infrared imaging using bimaterial microcantilever arrays

N. Lavrik, D. Grbovic, S. Rajic, P. Datskos, D. Forrai, E. Nelson, J. Devitt, B. McIntyre

Proceedings Volume 6206, 62061K (2006) https://doi.org/10.1117/12.666125

KEYWORDS: Infrared imaging, Microelectromechanical systems, Staring arrays, Sensors, Thermography, Imaging systems, Silicon, Prototyping, Infrared detectors, Head

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Proceedings Article | 17 May 2006 Paper

High quantum efficiency C-QWIP FPA based IR cameras

John Devitt, David Forrai, Darrel Endres, Richard Rawe, Bob Fischer, K. Choi, V. Swaminathan

Proceedings Volume 6206, 62060C (2006) https://doi.org/10.1117/12.664714

KEYWORDS: Quantum efficiency, Sensors, Staring arrays, Quantum well infrared photodetectors, Cameras, Infrared cameras, Polarization, Semiconducting wafers, Imaging systems, Electronics

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Proceedings Article | 16 May 2006 Paper

Test techniques for high performance thermal imaging system characterization

David Forrai, Stephen Bertke, Robert Fischer, Thomas Back

Proceedings Volume 6207, 62070Q (2006) https://doi.org/10.1117/12.664894

KEYWORDS: Imaging systems, Electronics, Thermography, Black bodies, Staring arrays, Sensors, Interference (communication), Temperature metrology, Error analysis, Telecommunications

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Proceedings Article | 20 May 2005 Paper

EO/IR sensor performance for site perimeter security

David Forrai, John Devitt, Thomas Back, William Rogers, Steven Gaulding

Proceedings Volume 5778, (2005) https://doi.org/10.1117/12.604440

KEYWORDS: Cameras, Infrared cameras, Sensors, Staring arrays, Infrared imaging, Video, Surveillance, Homeland security, Imaging systems, Video surveillance

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Proceedings Article | 24 August 1998 Paper

Upgrading and expanding capabilities in the advanced IRCM assessment model

Alan Kerrick, David Forrai, Steven Samadi, James Maier

Proceedings Volume 3369, (1998) https://doi.org/10.1117/12.319336

KEYWORDS: Infrared countermeasures, Missiles, Aerodynamics, Analytical research, Data modeling, Thermal modeling, Motion models, Systems modeling, Carbon dioxide, Infrared radiation

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Showing 5 of 22 publications

Conference Committee Involvement (15)

QSIP 2020

5 July 2020 |

QSIP 2018

16 June 2018 |

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX

17 April 2018 | Orlando, FL, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII

11 April 2017 | Anaheim, CA, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII

19 April 2016 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI

21 April 2015 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV

6 May 2014 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV

30 April 2013 | Baltimore, Maryland, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII

24 April 2012 | Baltimore, Maryland, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII

26 April 2011 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI

6 April 2010 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX

14 April 2009 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIX

18 March 2008 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII

11 April 2007 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVII

19 April 2006 | Orlando (Kissimmee), Florida, United States

Showing 5 of 15 Conference Committees

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