Prof. Gwanho Yoon
at Seoul National Univ of Science and Technology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 4 October 2023 Presentation
Proceedings Volume PC12646, PC126460F (2023) https://doi.org/10.1117/12.2672557
KEYWORDS: Dielectrics, Refractive index, Phase measurement, Optical components, Miniaturization, Incident light, Engineering, Chemical vapor deposition, Amorphous silicon

Proceedings Article | 4 October 2022 Presentation
Proceedings Volume PC12202, PC1220206 (2022) https://doi.org/10.1117/12.2632722
KEYWORDS: Dielectrics, Visible radiation, Amorphous silicon, Refractive index, Plasma enhanced chemical vapor deposition, Titanium dioxide, Silicon, Gallium nitride, Semiconductors, Plasma

Proceedings Article | 20 August 2020 Poster
Proceedings Volume 11467, 114672F (2020) https://doi.org/10.1117/12.2567588
KEYWORDS: Refractive index, Modulation, Atmospheric plasma, Optical properties, Plasma, Amorphous silicon, Diffraction, Silicon

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