Prof. Frank Schmidt
CEO at JCMwave GmbH
SPIE Involvement:
Author
Publications (65)

Proceedings Article | 16 February 2017 Presentation + Paper
N. Ledentsov, V. Shchukin, J.-R. Kropp, L. Zschiedrich, F. Schmidt
Proceedings Volume 10124, 101240O (2017) https://doi.org/10.1117/12.2253089
KEYWORDS: Dielectrics, Light emitting diodes, Semiconductors, Photonic crystals, Etching, Diodes, Distributed Bragg reflectors, Vertical cavity surface emitting lasers, Multilayers, Refractive index, Oxides, Light sources, Light, Quantum wells

Proceedings Article | 29 April 2016 Paper
Klaus Jäger, Grit Köppel, Carlo Barth, Martin Hammerschmidt, Sven Herrmann, Sven Burger, Frank Schmidt, Christiane Becker
Proceedings Volume 9898, 989808 (2016) https://doi.org/10.1117/12.2225459
KEYWORDS: Silicon, Thin film solar cells, Solar cells, Thin films, Antireflective coatings, Diffraction gratings, Numerical simulations, Finite element methods, Thin film solar cells, Refractive index, Interfaces, Polarization, Maxwell's equations, Absorption

Proceedings Article | 14 March 2016 Paper
Martin Hammerschmidt, Carlo Barth, Jan Pomplun, Sven Burger, Christiane Becker, Frank Schmidt
Proceedings Volume 9756, 97561R (2016) https://doi.org/10.1117/12.2212482
KEYWORDS: Photonic crystals, Electromagnetism, Finite element methods, Chemical elements, Electroluminescent displays, Silicon, Reflectivity, Solids, Resonance enhancement, Electromagnetic scattering

Proceedings Article | 14 March 2016 Paper
Philipp Gutsche, Lisa Poulikakos, Martin Hammerschmidt, Sven Burger, Frank Schmidt
Proceedings Volume 9756, 97560X (2016) https://doi.org/10.1117/12.2209551
KEYWORDS: Polarization, Interfaces, Electromagnetism, Electroluminescent displays, Radio propagation, Magnetism, Wave propagation, Integrated optics, Finite element methods, Anisotropy

Proceedings Article | 8 March 2016 Paper
Proceedings Volume 9778, 977839 (2016) https://doi.org/10.1117/12.2219666
KEYWORDS: Finite element methods, Electromagnetism, Computer simulations, Optical metrology, Semiconductors, Light scattering, 3D metrology, Scatterometry, Computational lithography, Numerical analysis, Silicon, Scattering, Polarization, Metrology, Maxwell's equations, Computing systems

Proceedings Article | 4 March 2016 Paper
Martin Hammerschmidt, Sven Herrmann, Jan Pomplun, Sven Burger, Frank Schmidt
Proceedings Volume 9742, 97420M (2016) https://doi.org/10.1117/12.2212367
KEYWORDS: Maxwell equations, Transistors, Modeling, Nanostructures, Finite element methods, Optical components, Photonics, Optical properties, Error analysis, Electroluminescent displays, Maxwell's equations, Electromagnetic scattering, Fourier transforms, Computer simulations

Proceedings Article | 4 March 2016 Paper
N. Ledentsov, V. Shchukin, J.-R. Kropp, S. Burger, F. Schmidt
Proceedings Volume 9766, 976608 (2016) https://doi.org/10.1117/12.2208909
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Visualization, Modulation, Electroluminescence, 3D modeling, Data modeling, Zinc, CCD cameras, Neodymium, Ions

Proceedings Article | 23 September 2015 Paper
Sven Burger, Philipp Gutsche, Martin Hammerschmidt, Sven Herrmann, Jan Pomplun, Frank Schmidt, Benjamin Wohlfeil, Lin Zschiedrich
Proceedings Volume 9630, 96300S (2015) https://doi.org/10.1117/12.2190119
KEYWORDS: Finite element methods, Electromagnetism, Absorption, Interfaces, Optical components, Maxwell's equations, Optical design, 3D equipment, Visualization, Transparent conductors

Proceedings Article | 23 September 2015 Paper
Martin Hammerschmidt, Sven Herrmann, Jan Pomplun, Lin Zschiedrich, Sven Burger, Frank Schmidt
Proceedings Volume 9630, 96300R (2015) https://doi.org/10.1117/12.2190425
KEYWORDS: Error analysis, Electroluminescent displays, Chemical elements, Maxwell's equations, Finite element methods, Nanophotonics, Instrument modeling, Photonic crystals, Silicon, Resonance enhancement

Proceedings Article | 20 March 2015 Paper
Proceedings Volume 9381, 93810V (2015) https://doi.org/10.1117/12.2077012
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Near field optics, Near field, Refractive index, 3D modeling, Waveguides, Reflectivity, Resistance, Semiconductors

Proceedings Article | 19 March 2015 Paper
Proceedings Volume 9424, 94240Z (2015) https://doi.org/10.1117/12.2085795
KEYWORDS: Light scattering, Finite element methods, Roentgenium, 3D metrology, Electromagnetism, Discretization errors, Optical metrology, Metrology, Silicon

Proceedings Article | 4 March 2015 Paper
Nikolay Ledentsov, Jörg-R. Kropp, Vitaly Shchukin, Gunther Steinle, Jarek Turkiewicz, Bo Wu, Shaofeng Qiu, Yanan Ma, Zhiyong Feng, Sven Burger, Frank Schmidt, Christoph Caspar, Ronald Freund, Kent Choquette
Proceedings Volume 9381, 93810F (2015) https://doi.org/10.1117/12.2082951
KEYWORDS: Vertical cavity surface emitting lasers, Modulation, Oxides, Optical fibers, Multimode fibers, Dielectrics, Electro optics, Dispersion, Photonic crystals, Near field

Proceedings Article | 15 May 2014 Paper
Daniel Lockau, M. Hammerschmidt, Jan Haschke, Mark Blome, F. Ruske, F. Schmidt, B. Rech
Proceedings Volume 9140, 914006 (2014) https://doi.org/10.1117/12.2052362
KEYWORDS: Glasses, Silicon, Transmittance, Interfaces, Silica, Solar cells, Light scattering, Antireflective coatings, Scattering, Titanium dioxide

Proceedings Article | 8 March 2014 Paper
Benjamin Wohlfeil, Sven Burger, Christos Stamatiadis, Jan Pomplun, Frank Schmidt, Lars Zimmermann, Klaus Petermann
Proceedings Volume 8988, 89880K (2014) https://doi.org/10.1117/12.2044461
KEYWORDS: Waveguides, Waveguide modes, Polarization, 3D modeling, Optical design, Light scattering, Numerical simulations, Multiplexing, Computer simulations, Scattering

Proceedings Article | 7 March 2014 Paper
Martin Hammerschmidt, Jan Pomplun, Sven Burger, Frank Schmidt
Proceedings Volume 8980, 89801O (2014) https://doi.org/10.1117/12.2036363
KEYWORDS: 3D modeling, Solar cells, Error analysis, MATLAB, Finite element methods, Chemical elements, Nanophotonics, Metrology, Scattering, Device simulation

Proceedings Article | 7 March 2014 Paper
Martin Hammerschmidt, Daniel Lockau, Lin Zschiedrich, Frank Schmidt
Proceedings Volume 8980, 898007 (2014) https://doi.org/10.1117/12.2036346
KEYWORDS: Glasses, Chemical elements, Finite element methods, Solar cells, Scattering, Electroluminescent displays, Light scattering, 3D modeling, Silicon, Multijunction solar cells

Proceedings Article | 9 October 2013 Paper
Proceedings Volume 8880, 88801Z (2013) https://doi.org/10.1117/12.2026213
KEYWORDS: Finite element methods, Electromagnetism, Computer simulations, Metrology, Stanford Linear Collider, Silver, Near field, Sensors, Numerical analysis, Chemical elements

Proceedings Article | 25 September 2013 Paper
Christiane Becker, Jolly Xavier, Veit Preidel, Philippe Wyss, Tobias Sontheimer, Bernd Rech, Jürgen Probst, Christoph Hülsen, Bernd Löchel, Alexei Erko, Sven Burger, Frank Schmidt, Franziska Back, Eveline Rudigier-Voigt
Proceedings Volume 8824, 88240D (2013) https://doi.org/10.1117/12.2023871
KEYWORDS: Silicon, Absorption, Glasses, Crystals, Nanophotonics, Silicon films, Thin film solar cells, Sol-gels, Solids, Solar cells

Proceedings Article | 10 April 2013 Paper
Proceedings Volume 8681, 868119 (2013) https://doi.org/10.1117/12.2011154
KEYWORDS: Computer simulations, Light scattering, Optical metrology, Scatterometry, Electromagnetism, Finite element methods, Near field, Critical dimension metrology, Scattering, Statistical modeling

Proceedings Article | 25 March 2013 Paper
Martin Hammerschmidt, Daniel Lockau, Sven Burger, Frank Schmidt, Christoph Schwanke, Simon Kirner, Sonya Calnan, Bernd Stannowski, Bernd Rech
Proceedings Volume 8620, 86201H (2013) https://doi.org/10.1117/12.2001789
KEYWORDS: Monte Carlo methods, Absorption, Interfaces, Solar cells, Chemical elements, 3D modeling, Computer simulations, Transparent conductors, Finite element methods, Prisms

Proceedings Article | 6 March 2013 Paper
C. Arellano, S. Mingaleev, I. Koltchanov, A. Richter, J. Pomplun, S. Burger, F. Schmidt
Proceedings Volume 8627, 862711 (2013) https://doi.org/10.1117/12.2004378
KEYWORDS: Photonic integrated circuits, Device simulation, Waveguides, Finite element methods, Chemical elements, Instrument modeling, 3D modeling, Integrated circuit design, Integrated optics, Ions

Proceedings Article | 5 March 2013 Paper
Proceedings Volume 8642, 864205 (2013) https://doi.org/10.1117/12.2001094
KEYWORDS: Finite element methods, Photonic crystal fibers, Plasmonics, Photonic crystals, Solar cells, Optical simulations, Nano optics, Integrated optics, Computer simulations, Photomasks

Proceedings Article | 4 March 2013 Paper
Proceedings Volume 8641, 86410B (2013) https://doi.org/10.1117/12.2001132
KEYWORDS: Organic light emitting diodes, Finite element methods, Einsteinium, Nanostructures, Maxwell's equations, Numerical analysis, OLED lighting, Computer simulations, Photonic crystals, Light emitting diodes

Proceedings Article | 28 February 2012 Paper
Jan Pomplun, Hans Wenzel, Sven Burger, Lin Zschiedrich, Maria Rozova, Frank Schmidt, Paul Crump, Hossein Ekhteraei, Christoph Schultz, Götz Erbert
Proceedings Volume 8255, 825510 (2012) https://doi.org/10.1117/12.909330
KEYWORDS: Semiconductor lasers, High power lasers, Refractive index, Optical simulations, Thermal effects, Chemical elements, Maxwell's equations, Thermal blooming, Electro optical modeling, Thermal modeling

Proceedings Article | 28 February 2012 Paper
Proceedings Volume 8255, 82550K (2012) https://doi.org/10.1117/12.906372
KEYWORDS: Vertical cavity surface emitting lasers, Finite element methods, 3D modeling, Chemical elements, Computer simulations, Optical simulations, Visualization, Thermal effects, Optical components, Maxwell's equations

Proceedings Article | 21 February 2012 Paper
Felix Schlosser, Mario Schoth, Kirankumar Hiremath, Sven Burger, Frank Schmidt, Andreas Knorr, Shaul Mukamel, Marten Richter
Proceedings Volume 8260, 82601V (2012) https://doi.org/10.1117/12.906671
KEYWORDS: Quantum dots, Spectroscopy, Excitons, Polarization, Metals, Nanoplasmonics, Silver, Nanostructures, Field spectroscopy, Waveguides

Proceedings Article | 14 October 2011 Paper
Proceedings Volume 8166, 81661Q (2011) https://doi.org/10.1117/12.896839
KEYWORDS: Extreme ultraviolet, Diffraction, Photomasks, Scatterometry, Computer simulations, Numerical simulations, Multilayers, Sensors, 3D metrology, Extreme ultraviolet lithography

Proceedings Article | 23 May 2011 Paper
Proceedings Volume 8083, 80831B (2011) https://doi.org/10.1117/12.889831
KEYWORDS: Diffraction, Extreme ultraviolet, Photomasks, Computer simulations, Light scattering, Mirrors, Finite element methods, Near field, Extreme ultraviolet lithography, 3D metrology

Proceedings Article | 23 May 2011 Paper
Proceedings Volume 8083, 808309 (2011) https://doi.org/10.1117/12.889364
KEYWORDS: Finite element methods, Diffraction, Maxwell's equations, Error analysis, Diffraction gratings, Inverse scattering, Scattering, Electromagnetism, Electromagnetic scattering, Polarization

Proceedings Article | 23 May 2011 Paper
Proceedings Volume 8083, 808308 (2011) https://doi.org/10.1117/12.889892
KEYWORDS: Scatterometry, Extreme ultraviolet, Error analysis, Data modeling, Diffraction, Chemical elements, Computer simulations, Finite element methods, Maxwell's equations, Reliability

Proceedings Article | 21 February 2011 Paper
Proceedings Volume 7933, 79331B (2011) https://doi.org/10.1117/12.874752
KEYWORDS: Chemical elements, Condition numbers, Refractive index, Resonators, Numerical analysis, Matrices, Finite element methods, Waveguides, Inspection, Physics

Proceedings Article | 21 February 2011 Paper
Proceedings Volume 7933, 79330T (2011) https://doi.org/10.1117/12.875044
KEYWORDS: Computer simulations, Finite element methods, Nickel, Optical microcavities, Waveguides, Waveguide modes, Modulation, Photonic nanostructures, Dielectrics, Photonic crystals

Proceedings Article | 21 February 2011 Paper
Daniel Lockau, Lin Zschiedrich, Sven Burger, Frank Schmidt, Florian Ruske, Bernd Rech
Proceedings Volume 7933, 79330M (2011) https://doi.org/10.1117/12.874967
KEYWORDS: Monte Carlo methods, Silicon, Absorption, Transparent conductors, Interfaces, Solar cells, Glasses, Chemical elements, Silicon films, Optical simulations

Proceedings Article | 17 January 2011 Paper
Proceedings Volume 7941, 79410G (2011) https://doi.org/10.1117/12.874726
KEYWORDS: Computer simulations, Photomasks, Chemical elements, Nanophotonics, Optical metrology, Optical lithography, Optical proximity correction, 3D modeling, Source mask optimization, Inverse problems

Proceedings Article | 25 September 2010 Paper
Proceedings Volume 7823, 78230E (2010) https://doi.org/10.1117/12.866101
KEYWORDS: Source mask optimization, Chemical elements, Photomasks, Error analysis, Optimization (mathematics), Near field, Lithography, Maxwell's equations, Semiconducting wafers, Reliability

Proceedings Article | 24 February 2010 Paper
Proceedings Volume 7609, 76091Q (2010) https://doi.org/10.1117/12.841867
KEYWORDS: Waveguides, Optical microcavities, Photonic crystals, Finite element methods, Computer simulations, Silicon, Light scattering, Resonators, Light wave propagation, Silica

Proceedings Article | 17 February 2010 Paper
Proceedings Volume 7606, 760610 (2010) https://doi.org/10.1117/12.842061
KEYWORDS: Resonators, Waveguides, Silicon, Waveguide modes, Chemical elements, Finite element methods, Nickel, Optical properties, Integrated photonics, Switching

Proceedings Article | 12 February 2010 Paper
Proceedings Volume 7604, 76040F (2010) https://doi.org/10.1117/12.841995
KEYWORDS: Plasmonic waveguides, Waveguides, Light wave propagation, Finite element methods, Computer simulations, Silver, Visualization, Magnesium fluoride, Resonators, Nanowires

Proceedings Article | 23 September 2009 Paper
Proceedings Volume 7488, 74882B (2009) https://doi.org/10.1117/12.829639
KEYWORDS: Error analysis, Chemical elements, Optical proximity correction, Photomasks, Computational lithography, Reliability, Semiconducting wafers, Near field, Computer simulations, Scatterometry

Proceedings Article | 17 June 2009 Paper
Proceedings Volume 7390, 73900I (2009) https://doi.org/10.1117/12.827588
KEYWORDS: Error analysis, Chemical elements, Computer simulations, Electromagnetic scattering, Diffraction, Reliability, Finite element methods, Phase shifts, 3D modeling, Light scattering

Proceedings Article | 17 June 2009 Paper
Proceedings Volume 7390, 73900H (2009) https://doi.org/10.1117/12.827543
KEYWORDS: Finite element methods, Metals, Chemical elements, Computer simulations, Maxwell's equations, Numerical analysis, Silver, Lithium, Near field, Surface plasmons

Proceedings Article | 20 May 2009 Paper
Proceedings Volume 7366, 736621 (2009) https://doi.org/10.1117/12.822828
KEYWORDS: Finite element methods, Computer simulations, Silver, Maxwell's equations, Nanostructures, Finite-difference time-domain method, Near field, Numerical analysis, Light scattering, 3D modeling

Proceedings Article | 17 October 2008 Paper
Proceedings Volume 7122, 71221S (2008) https://doi.org/10.1117/12.801248
KEYWORDS: Finite element methods, Photomasks, Near field, Waveguides, Computer simulations, Lithography, Electromagnetism, Diffraction, Cadmium, Interfaces

Proceedings Article | 19 May 2008 Paper
Proceedings Volume 7028, 702831 (2008) https://doi.org/10.1117/12.793107
KEYWORDS: Scattering, Maxwell's equations, Photomasks, Radio propagation, Waveguides, Chemical elements, Scatterometry, Magnetism, Electromagnetism, Systems modeling

Proceedings Article | 19 May 2008 Paper
Proceedings Volume 7028, 70280P (2008) https://doi.org/10.1117/12.793032
KEYWORDS: Extreme ultraviolet, Diffraction, Finite element methods, Photomasks, Scanning electron microscopy, Critical dimension metrology, Chemical elements, Cadmium, Scatterometry, Maxwell's equations

Proceedings Article | 21 March 2008 Paper
Proceedings Volume 6921, 69213R (2008) https://doi.org/10.1117/12.771923
KEYWORDS: Extreme ultraviolet, Scatterometry, Critical dimension metrology, Photomasks, Diffraction, Finite element methods, Multilayers, Extreme ultraviolet lithography, Reflectivity, Reflectometry

Proceedings Article | 7 March 2008 Paper
Proceedings Volume 6924, 69243I (2008) https://doi.org/10.1117/12.772987
KEYWORDS: Photomasks, Finite element methods, Lithography, Matrices, Linear elements, Error analysis, Diffraction, Polarization, Solids, Phase shifts

Proceedings Article | 7 March 2008 Paper
Proceedings Volume 6924, 692450 (2008) https://doi.org/10.1117/12.771989
KEYWORDS: Maxwell's equations, Electromagnetism, Finite element methods, Photomasks, Chemical elements, Near field, Wave propagation, Computer simulations, Interfaces, Optical lithography

Proceedings Article | 12 February 2008 Paper
Proceedings Volume 6896, 689602 (2008) https://doi.org/10.1117/12.765720
KEYWORDS: Finite element methods, Chemical elements, Waveguides, Maxwell's equations, Cladding, Refractive index, Wave propagation, Zoom lenses, Photonic crystal fibers, Surface plasmons

Proceedings Article | 30 October 2007 Paper
Proceedings Volume 6730, 67301W (2007) https://doi.org/10.1117/12.746392
KEYWORDS: Finite element methods, Photomasks, Computer simulations, Critical dimension metrology, Near field, Chemical elements, Light scattering, Chromium, Optical lithography, Electromagnetism

Proceedings Article | 18 June 2007 Paper
Proceedings Volume 6617, 66171A (2007) https://doi.org/10.1117/12.726159
KEYWORDS: Extreme ultraviolet, Diffraction, Scatterometry, Critical dimension metrology, Photomasks, Scattering, Light scattering, Finite element methods, Reflectometry, Reflectivity

Proceedings Article | 18 June 2007 Paper
Proceedings Volume 6617, 661718 (2007) https://doi.org/10.1117/12.726156
KEYWORDS: Diffraction, Extreme ultraviolet, Finite element methods, Photomasks, Scatterometry, Scatter measurement, Computer simulations, Extreme ultraviolet lithography, Scanning electron microscopy, Scattering

Proceedings Article | 18 June 2007 Paper
Proceedings Volume 6617, 66170V (2007) https://doi.org/10.1117/12.726236
KEYWORDS: Etching, Diffraction, Finite element methods, Photomasks, Computer simulations, Chemical elements, Electromagnetism, Optical lithography, Nanostructures, Radio propagation

Proceedings Article | 9 February 2007 Paper
Proceedings Volume 6475, 64750H (2007) https://doi.org/10.1117/12.698167
KEYWORDS: Waveguides, Error analysis, Wave propagation, Chemical elements, Finite element methods, Optical components, Radio propagation, Optical simulations, Waveguide modes, Electromagnetism

Proceedings Article | 5 February 2007 Paper
Proceedings Volume 6480, 64800M (2007) https://doi.org/10.1117/12.700495
KEYWORDS: Finite element methods, Photonic crystal fibers, Cladding, Optical fibers, Refractive index, Adaptive optics, Photonic crystals, Chemical elements, Interfaces, Numerical analysis

Proceedings Article | 20 October 2006 Paper
Proceedings Volume 6349, 63493D (2006) https://doi.org/10.1117/12.686828
KEYWORDS: Extreme ultraviolet, Finite element methods, Diffraction, Scatterometry, Photomasks, Scatter measurement, Computer simulations, Numerical simulations, Critical dimension metrology, Scattering

Proceedings Article | 20 October 2006 Paper
Proceedings Volume 6349, 63494Z (2006) https://doi.org/10.1117/12.687816
KEYWORDS: Finite element methods, Chemical elements, Photomasks, Computer simulations, Lithography, Image processing, Diffraction, Polarization, Airborne remote sensing, Photoresist processing

Proceedings Article | 20 April 2006 Paper
Proceedings Volume 6195, 61950C (2006) https://doi.org/10.1117/12.662942
KEYWORDS: Finite element methods, Magnetism, Chemical elements, Computer simulations, Near infrared, Metamaterials, Optical lithography, Light scattering, Numerical analysis, Photomasks

Proceedings Article | 28 February 2006 Paper
Proceedings Volume 6115, 611515 (2006) https://doi.org/10.1117/12.646252
KEYWORDS: Prisms, Finite element methods, Scattering, Numerical analysis, Light scattering, Metamaterials, Magnetism, Radio propagation, Computing systems, Split ring resonators

Proceedings Article | 5 November 2005 Paper
Proceedings Volume 5992, 599216 (2005) https://doi.org/10.1117/12.631696
KEYWORDS: Finite element methods, Photomasks, Computer simulations, Diffraction, Finite-difference time-domain method, Polarization, Chemical elements, Solids, Waveguides, Lithography

Proceedings Article | 27 September 2005 Paper
Sven Burger, Lin Zschiedrich, Roland Klose, Achim Schädle, Frank Schmidt, Christian Enkrich, Stefan Linden, Martin Wegener, Costas Soukoulis
Proceedings Volume 5955, 595503 (2005) https://doi.org/10.1117/12.622184
KEYWORDS: Magnetism, Split ring resonators, Geometrical optics, Near infrared, Light scattering, Chemical elements, Metamaterials, Finite element methods, Polarization, Gold

Proceedings Article | 31 March 2005 Paper
Sven Burger, Roland Klose, Achim Schaedle, Frank Schmidt, Lin Zschiedrich
Proceedings Volume 5728, (2005) https://doi.org/10.1117/12.585895
KEYWORDS: Photonic crystals, Waveguides, Chemical elements, 3D modeling, Finite element methods, Magnetism, Light scattering, Refractive index, Scattering, Error analysis

Proceedings Article | 31 March 2005 Paper
Lin Zschiedrich, Sven Burger, Roland Klose, Achim Schaedle, Frank Schmidt
Proceedings Volume 5728, (2005) https://doi.org/10.1117/12.590372
KEYWORDS: Waveguides, Chemical elements, Lab on a chip, Wave propagation, Metals, Refractive index, Magnetism, Error analysis, Optical design, Silicon

Proceedings Article | 19 June 2003 Paper
Proceedings Volume 4987, (2003) https://doi.org/10.1117/12.474356
KEYWORDS: Error analysis, Chemical elements, Waveguides, Mathematical modeling, Optical fibers, Numerical analysis, Integrated optics, Zoom lenses, Computer simulations, Magnetism

Proceedings Article | 25 August 1994 Paper
Proceedings Volume 2212, (1994) https://doi.org/10.1117/12.185149
KEYWORDS: Chemical elements, Wave propagation, Matrices, Error analysis, Finite element methods, Integrated optics, Computer simulations, Waveguides, Optical components, Refractive index

Showing 5 of 65 publications
Conference Committee Involvement (6)
Integrated Optics: Devices, Materials, and Technologies XVIII
3 February 2014 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XVII
5 February 2013 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XVI
23 January 2012 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XV
24 January 2011 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XIV
25 January 2010 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XIII
26 January 2009 | San Jose, California, United States
Showing 5 of 6 Conference Committees
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