PROCEEDINGS VOLUME 8788
SPIE OPTICAL METROLOGY 2013 | 13-16 MAY 2013
Optical Measurement Systems for Industrial Inspection VIII
Editor Affiliations +
Proceedings Volume 8788 is from: Logo
SPIE OPTICAL METROLOGY 2013
13-16 May 2013
Munich, Germany
Front Matter: Volume 8788
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878801 (2013) https://doi.org/10.1117/12.2028782
Interferometric Techniques
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878802 (2013) https://doi.org/10.1117/12.2025199
Yangjin Kim, Kenichi Hibino, Kanako Harada, Naohiko Sugita, Mamoru Mitsuishi
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878803 (2013) https://doi.org/10.1117/12.2020327
Po-Yi Chang, Yi-Sha Ku, Chia-Hung Cho
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878804 (2013) https://doi.org/10.1117/12.2020437
Nikolay Voznesenskiy, Mariia Voznesenskaia, Natalia Petrova, Artur Abels
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878805 (2013) https://doi.org/10.1117/12.2020618
Digital Holography and Holographic Microscopy
Pasquale Memmolo, Maria Iannone, Maurizio Ventre, Paolo A. Netti, Andrea Finizio, Melania Paturzo, Pietro Ferraro
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878806 (2013) https://doi.org/10.1117/12.2020554
C. Thizy, F. Eliot, D. Ballhause, K. R. Olympio, R. Kluge, A. Shannon, G. Laduree, D. Logut, M. P. Georges
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878807 (2013) https://doi.org/10.1117/12.2020542
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878808 (2013) https://doi.org/10.1117/12.2020580
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878809 (2013) https://doi.org/10.1117/12.2020298
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880A (2013) https://doi.org/10.1117/12.2020980
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880B (2013) https://doi.org/10.1117/12.2022550
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880D (2013) https://doi.org/10.1117/12.2020564
Measurement of Optical Components and Systems
A. Ritucci, M. Rossi
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880E (2013) https://doi.org/10.1117/12.2020915
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880G (2013) https://doi.org/10.1117/12.2020589
Digital Holography, Shearography, and Speckle Techniques
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880I (2013) https://doi.org/10.1117/12.2020471
M. Yokota, T. Koyama, T. Kawakami
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880J (2013) https://doi.org/10.1117/12.2020371
Massimiliano Locatelli, Eugenio Pugliese, Melania Paturzo, Vittorio Bianco, Andrea Finizio, Anna Pelagotti, Pasquale Poggi, Lisa Miccio, Riccardo Meucci, et al.
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880K (2013) https://doi.org/10.1117/12.2020921
A. V. Fantin, D. P. Willemann, M. Viotti, A. Albertazzi
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880L (2013) https://doi.org/10.1117/12.2020978
Y. Arai, S. Yokozeki
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880M (2013) https://doi.org/10.1117/12.2019204
Polarization-based Techniques
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880O (2013) https://doi.org/10.1117/12.2020842
Seung Hyun Lee, Min Young Kim
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880P (2013) https://doi.org/10.1117/12.2020736
High-Speed Techniques
Patrick Lambelet, Rudolf Moosburger
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880Q (2013) https://doi.org/10.1117/12.2020617
Holger Knell, Peter Lehmann
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880R (2013) https://doi.org/10.1117/12.2020121
Miro Taphanel, Bastiaan Hovestreydt, Jürgen Beyerer
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880S (2013) https://doi.org/10.1117/12.2020387
Confocal Sensors
Jörg Seewig, Indek Raid, Christian Wiehr, Bini Alapurath George
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880T (2013) https://doi.org/10.1117/12.2020551
F. Mauch, W. Lyda, W. Osten
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880U (2013) https://doi.org/10.1117/12.2019991
Matthias Hillenbrand, Adrian Grewe, Mohamed Bichra, Roman Kleindienst, Lucia Lorenz, Raoul Kirner, Robert Weiß, Stefan Sinzinger
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880V (2013) https://doi.org/10.1117/12.2020334
Tobias Boettcher, Wolfram Lyda, Marc Gronle, Florian Mauch, Wolfgang Osten
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880W (2013) https://doi.org/10.1117/12.2020558
Multisensor Approaches
O. Birli, K.-H. Franke, G. Linß, T. Machleidt, E. Manske, F. Schale, H.-C. Schwannecke, E. Sparrer, M. Weiß
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880X (2013) https://doi.org/10.1117/12.2020538
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880Y (2013) https://doi.org/10.1117/12.2020463
Fiber-Optics Sensors
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87880Z (2013) https://doi.org/10.1117/12.2019249
P. Putzer, N. Kuhenuri, A. W. Koch, S. Schweyer, A. Hurni, M. Plattner
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878810 (2013) https://doi.org/10.1117/12.2020495
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878811 (2013) https://doi.org/10.1117/12.2019799
Biqiang Jiang, Jianlin Zhao, Abdul Rauf, Chuan Qin, Wei Jiang
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878812 (2013) https://doi.org/10.1117/12.2019874
Fringe Projection
Peter Lutzke, Martin Schaffer, Peter Kühmstedt, Richard Kowarschik, Gunther Notni
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878813 (2013) https://doi.org/10.1117/12.2020910
Marc Honegger, Michael Kahl, Sandra Trunz, Stefan Rinner, Andreas Ettemeyer, Patrick Lambelet
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878814 (2013) https://doi.org/10.1117/12.2020260
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878815 (2013) https://doi.org/10.1117/12.2020539
Marcus Große, Martin Schaffer, Bastian Harendt, Richard Kowarschik
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878816 (2013) https://doi.org/10.1117/12.2020448
Christoph Ohrt, Markus Kästner, Eduard Reithmeier
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878817 (2013) https://doi.org/10.1117/12.2020440
Asphere Measurement
Goran Baer, Johannes Schindler, Jens Siepmann, Christof Pruß, Wolfgang Osten, Michael Schulz
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878818 (2013) https://doi.org/10.1117/12.2021518
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878819 (2013) https://doi.org/10.1117/12.2020572
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881A (2013) https://doi.org/10.1117/12.2020302
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881B (2013) https://doi.org/10.1117/12.2020427
Deflectometry
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881C (2013) https://doi.org/10.1117/12.2020578
E. Hofbauer, R. Rascher, Th. Stubenrauch, J. Liebl, R. Maurer, A. Zimmermann, O. Rösch, J. Reitberger
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881D (2013) https://doi.org/10.1117/12.2020414
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881E (2013) https://doi.org/10.1117/12.2020721
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881F (2013) https://doi.org/10.1117/12.2020534
Tomohiro Hirose, Tsunaji Kitayama
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881G (2013) https://doi.org/10.1117/12.2014630
Measurements of Large-Scale Objects
Pedro D. V. Buschinelli, João Ricardo C. Melo, Armando Albertazzi Jr., João M. C. Santos, Claudio S. Camerini
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881H (2013) https://doi.org/10.1117/12.2020966
O. Hofherr, C. Wachten, C. Müller, H. Reinecke
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881I (2013) https://doi.org/10.1117/12.2020499
Teuvo Heimonen, Jukka Leinonen, Jani Sipola
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881J (2013) https://doi.org/10.1117/12.2019246
Toshifumi Kodama, Teruhisa Iwata, Daisaku Yamagami, Keiji Takagi
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881K (2013) https://doi.org/10.1117/12.2020332
Aneta Zatočilová, Radek Poliščuk, David Paloušek, Jan Brandejs
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881L (2013) https://doi.org/10.1117/12.2020917
Light Scattering Techniques and Linewidth Measurement
Henk-Jan H. Smilde, Martin Jak, Arie den Boef, Mark van Schijndel, Murat Bozkurt, Andreas Fuchs, Maurits van der Schaar, Steffen Meyer, Stephen Morgan, et al.
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881N (2013) https://doi.org/10.1117/12.2020930
Oliver Paul, Frank Widulle, Bernd H. Kleemann, Andreas Heinrich
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881O (2013) https://doi.org/10.1117/12.2020880
N. Kumar, O. El Gawhary, S. Roy, S. F. Pereira, H. P. Urbach
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881P (2013) https://doi.org/10.1117/12.2020506
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881Q (2013) https://doi.org/10.1117/12.2020561
Hock-Chun Chin, Bin Liu, Xingui Zhang, Moh-Lung Ling, Chan-Hoe Yip, Yongdong Liu, Jiangtao Hu, Yee-Chia Yeo
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881R (2013) https://doi.org/10.1117/12.2020248
Bernd Bodermann, Rainer Köning, Detlef Bergmann, Egbert Buhr, Wolfgang Hässler-Grohne, Jens Flügge, Harald Bosse
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881S (2013) https://doi.org/10.1117/12.2021888
Laser-Doppler Techniques
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881T (2013) https://doi.org/10.1117/12.2020168
Moritz Giesen, Robert Kowarsch, Wanja Ochs, Marcus Winter, Christian Rembe
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881U (2013) https://doi.org/10.1117/12.2019342
T. Haist, C. Lingel, W. Osten, K. Bendel, M. Giesen, M. Gartner, C. Rembe
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881V (2013) https://doi.org/10.1117/12.2020475
Stress, Strain, & Displacement Measurement
M. Malesa, M. Kujawińska, K. Malowany, B. Siwek
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881X (2013) https://doi.org/10.1117/12.2021580
Antonio Baldi, Filippo Bertolino
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881Y (2013) https://doi.org/10.1117/12.2020758
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87881Z (2013) https://doi.org/10.1117/12.2021039
Poster Session
S. Roose, Y. Stockman, Z. Sodnik
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878820 (2013) https://doi.org/10.1117/12.2020341
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878822 (2013) https://doi.org/10.1117/12.2020411
Jan Skřínský, Zdeněk Zelinger, Václav Nevrlý, Tomáš Hejzlar, Barbora Baudišová, Petr Bitala
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878823 (2013) https://doi.org/10.1117/12.2020407
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878824 (2013) https://doi.org/10.1117/12.2020404
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878825 (2013) https://doi.org/10.1117/12.2020385
Guanxiao Cheng, Ping Xu, Chunquan Hong, Yang Cao, Feng Zhu, Shuyang Feng, Ruibin Lin
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878826 (2013) https://doi.org/10.1117/12.2020384
Jianglei Di, Bingjing Wu, Xin Chen, Junjiang Liu, Jun Wang, Jianlin Zhao
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878827 (2013) https://doi.org/10.1117/12.2020370
Jianlin Zhao, Jianglei Di, Bingjing Wu, Jun Wang, Qian Wang, Hongzhen Jiang
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878828 (2013) https://doi.org/10.1117/12.2020369
Junzheng Peng, Dongbao Ge, Yingjie Yu, Mingyi Chen
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878829 (2013) https://doi.org/10.1117/12.2018919
Igor A. Konyakhin, Alexandr N. Timofeev, Aleksey Konyakhin
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882C (2013) https://doi.org/10.1117/12.2020343
L. Cocola, M. Fedel, M. Mocellin, R. Casarin, L. Poletto
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882D (2013) https://doi.org/10.1117/12.2020288
P. Sansoni, D. Fontani, F. Francini, S. Toccafondi, M. Messeri, S. Coraggia, L. Mercatelli, D. Jafrancesco, E. Sani
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882E (2013) https://doi.org/10.1117/12.2020285
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882F (2013) https://doi.org/10.1117/12.2020253
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882G (2013) https://doi.org/10.1117/12.2020250
Milton P. Macedo, C. M. B. A. Correia
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882H (2013) https://doi.org/10.1117/12.2020244
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882J (2013) https://doi.org/10.1117/12.2016545
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882K (2013) https://doi.org/10.1117/12.2020113
Steffen Wittek
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882L (2013) https://doi.org/10.1117/12.2020058
L. Lages Martins, J. M. Rebordão, A. Silva Ribeiro
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882M (2013) https://doi.org/10.1117/12.2019996
Grzegorz Świrniak, Grzegorz Głomb
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882N (2013) https://doi.org/10.1117/12.2019981
Jie Feng, Chao Deng, Tingwen Xing
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882O (2013) https://doi.org/10.1117/12.2019864
Hana Chmelickova, Hana Sebestova, Martina Havelkova, Lenka Rihakova, Libor Nozka
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882P (2013) https://doi.org/10.1117/12.2021864
Jae Heung Jo, Sangon Lee, Hyeon Jin Seo, Jung Hwan Lee, Joon Mo Kim
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882Q (2013) https://doi.org/10.1117/12.2019743
Zhiwen Lu, Ningsong Peng
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882R (2013) https://doi.org/10.1117/12.2021032
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882S (2013) https://doi.org/10.1117/12.2021028
Andrey G. Anisimov, Anton V. Pantyushin, Oleg U. Lashmanov, A. S. Vasilev, Alexander N. Timofeev, Valery V. Korotaev, Sergey V. Gordeev
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882T (2013) https://doi.org/10.1117/12.2021022
G. Zauner, T. Schulte, C. Forsich, Daniel Heim
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882U (2013) https://doi.org/10.1117/12.2020969
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882V (2013) https://doi.org/10.1117/12.2020968
H. Funamizu, S. Shimoma, Y. Aizu
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882W (2013) https://doi.org/10.1117/12.2020961
Matias R. Viotti, Armando Albertazzi Jr., Peter Staron, Marcelo Pisa
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882X (2013) https://doi.org/10.1117/12.2020960
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882Y (2013) https://doi.org/10.1117/12.2020947
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87882Z (2013) https://doi.org/10.1117/12.2020923
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878831 (2013) https://doi.org/10.1117/12.2020865
Tatiana V. Turgalieva, Igor A. Konyakhin
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878832 (2013) https://doi.org/10.1117/12.2020861
Shijie Li, Fan Wu, Qiang Chen, Bin Fan, Lianghong Li
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878833 (2013) https://doi.org/10.1117/12.2019345
Valentin Ortega Clavero, Andreas Weber, Werner Schröder, Dan Curticapean, Patrick Meyrueis, Nicolas Javahiraly
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878834 (2013) https://doi.org/10.1117/12.2020780
Izmir Mamedbeili, Fahrettin Cakiroglu, Gokhan Bektas, Dadash Riza, Fikret Hacizade
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878835 (2013) https://doi.org/10.1117/12.2020763
Anton A. Maraev, Alexandr N. Timofeev
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878836 (2013) https://doi.org/10.1117/12.2020757
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878837 (2013) https://doi.org/10.1117/12.2020756
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 878839 (2013) https://doi.org/10.1117/12.2020747
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883A (2013) https://doi.org/10.1117/12.2020742
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883B (2013) https://doi.org/10.1117/12.2020739
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883C (2013) https://doi.org/10.1117/12.2020678
Arttu V. H. Ollikkala, Timo P. Kananen, Anssi J. Mäkynen, Markus Holappa
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883D (2013) https://doi.org/10.1117/12.2020646
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883E (2013) https://doi.org/10.1117/12.2019255
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883F (2013) https://doi.org/10.1117/12.2020579
P. C. Montgomery, F. Salzenstein, D. Montaner, B. Serio, P. Pfeiffer
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883G (2013) https://doi.org/10.1117/12.2020560
Iker Garcia, Josu Beloki, Joseba Zubia, Gaizka Durana, Gotzon Aldabaldetreku
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883H (2013) https://doi.org/10.1117/12.2020540
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883I (2013) https://doi.org/10.1117/12.2020529
Jeremias Seppä, Ivan Kassamakov, Anton Nolvi, Ville Heikkinen, Tor Paulin, Antti Lassila, Ling Hao, Edward Hæggsröm
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883J (2013) https://doi.org/10.1117/12.2020525
Zhelang Pan, Shiping Li, Jingang Zhong
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883K (2013) https://doi.org/10.1117/12.2020521
Eynas Amer, Jonas Stenvall, Per Gren, Mikael Sjödahl
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883M (2013) https://doi.org/10.1117/12.2020505
Toru Kurihara, Yugo Katsuki, Shigeru Ando
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883O (2013) https://doi.org/10.1117/12.2020497
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883P (2013) https://doi.org/10.1117/12.2020470
Proceedings Volume Optical Measurement Systems for Industrial Inspection VIII, 87883Q (2013) https://doi.org/10.1117/12.2020458
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