Prof. Gerald Zauner Profile

Prof. Gerald Zauner

Professor at Upper Austria University of Applied Sciences

SPIE Involvement:

Author

Proceedings Article | 7 March 2014 Paper

Machine vision based quality inspection of flat glass products

G. Zauner, M. Schagerl

Proceedings Volume 9024, 902402 (2014) https://doi.org/10.1117/12.2042520

KEYWORDS: Glasses, Inspection, Machine vision, Image processing, Image segmentation, Flat glass, Machine learning, Image sensors, Neural networks, Binary data

Read Abstract +

Proceedings Article | 13 May 2013 Paper

CCD camera-based analysis of thin film growth in industrial PACVD processes

G. Zauner, T. Schulte, C. Forsich, Daniel Heim

Proceedings Volume 8788, 87882U (2013) https://doi.org/10.1117/12.2020969

KEYWORDS: CCD cameras, Thin film growth, Image processing, Plasma, Temperature metrology, Oxides, Cameras, Signal processing, Thermography, Thin films

Read Abstract +

Proceedings Article | 6 March 2013 Paper

High-temperature dual-band thermal imaging by means of high-speed CMOS camera system

W. Hauer, G. Zauner

Proceedings Volume 8661, 866103 (2013) https://doi.org/10.1117/12.2002357

KEYWORDS: Temperature metrology, Pyrometry, Electrodes, Carbon, Calibration, High speed cameras, Imaging systems, Thermography, CMOS cameras, Image processing

Read Abstract +

Proceedings Article | 3 February 2009 Paper

Comparative defect evaluation of aircraft components by active thermography

G. Zauner, G. Mayr, G. Hendorfer

Proceedings Volume 7251, 72510J (2009) https://doi.org/10.1117/12.806795

KEYWORDS: Thermography, Nondestructive evaluation, Shearography, Ultrasonics, Visualization, Glasses, Computed tomography, Reflection, Testing and analysis, Carbon

Read Abstract +

Proceedings Article | 28 January 2009 Paper

Wavelet-based subsurface defect characterization in pulsed phase thermography for non-destructive evaluation

G. Zauner, G. Mayr, G. Hendorfer

Proceedings Volume 7248, 72480D (2009) https://doi.org/10.1117/12.805914

KEYWORDS: Thermography, Phase contrast, Wavelets, Reflection, Nondestructive evaluation, Interfaces, Fourier transforms, Infrared cameras, Diffusion, Signal attenuation

Read Abstract +

Proceedings Article | 28 April 2008 Paper

Optical characterization of thin layers grown on metal components

F. Mayrhofer, G. Zauner, G. Hendorfer, G. Darilion, T. Müller

Proceedings Volume 7003, 70030R (2008) https://doi.org/10.1117/12.781108

KEYWORDS: Refraction, Reflectivity, Oxides, Optical properties, Thin films, Metals, Near infrared, Refractive index, CCD cameras, Oxidation

Read Abstract +

Proceedings Article | 2 October 2007 Paper

Wavelet coherence analysis applied to laser vibrometry measurements

G. Zauner, C. Ramsauer, G. Hendorfer

Proceedings Volume 6763, 67630B (2007) https://doi.org/10.1117/12.733815

KEYWORDS: Wavelets, Vibrometry, Laser Doppler velocimetry, Doppler effect, Time-frequency analysis, Temporal resolution, Signal analysis, Wavelet transforms, Continuous wavelet transforms, Laser applications

Read Abstract +

Proceedings Article | 18 June 2007 Paper

Multiscale segmentation method for small inclusion detection in 3D industrial computed tomography

G. Zauner, B. Harrer, D. Angermaier, M. Reiter, J. Kastner

Proceedings Volume 6616, 66163Q (2007) https://doi.org/10.1117/12.726130

KEYWORDS: Image segmentation, Wavelets, Sensors, Denoising, Photons, X-ray computed tomography, Interference (communication), Computed tomography, 3D image processing, X-rays

Read Abstract +

Proceedings Article | 12 October 2006 Paper

Application of wavelet analysis in active thermography for non-destructive testing of CFRP composites

G. Zauner, G. Mayr, G. Hendorfer

Proceedings Volume 6383, 63830E (2006) https://doi.org/10.1117/12.685782

KEYWORDS: Wavelets, Thermography, Nondestructive evaluation, Phase contrast, Signal analysis, Fourier transforms, Wavelet transforms, Lamps, Reflection, Continuous wavelet transforms

Read Abstract +

Proceedings Article | 8 November 2005 Paper

Multiresolution denoising of CCD thermal images for improved spatial temperature resolution

Gerald Zauner, Guenther Hendorfer

Proceedings Volume 6001, 60010C (2005) https://doi.org/10.1117/12.630422

KEYWORDS: Denoising, Interference (communication), Temperature metrology, Thermography, Black bodies, Charge-coupled devices, Wavelets, Near infrared, Imaging systems, Image processing

Read Abstract +

Proceedings Article | 7 November 2005 Paper

Online inspection of thermo-chemical heat treatment processes with CCD camera system

Gerald Zauner, Gerald Darilion, Ronald Pree, Daniel Heim, G. Hendorfer

Proceedings Volume 6000, 600006 (2005) https://doi.org/10.1117/12.630449

KEYWORDS: CCD cameras, Plasma, Heat treatments, Imaging systems, Temperature metrology, Near infrared, Metals, Inspection, Optical filters, Black bodies

Read Abstract +

Proceedings Article | 13 June 2005 Paper

CCD based emissivity measurements for surface characterization in heat treatment processes

Gerald Zauner, Gerald Darilion, Daniel Heim, G. Hendorfer, Thomas Mueller

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612525

KEYWORDS: Metals, Heat treatments, Plasma, Charge-coupled devices, Near infrared, Photons, CCD cameras, Imaging systems, Optical filters, Interference (communication)

Read Abstract +

Proceedings Article | 10 September 2004 Paper

Processing of low-intensity CCD images for temperature mapping in industrial processes

Gerald Zauner, Daniel Heim, Kurt Niel, Guenther Hendorfer, Herbert Stoeri

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.545372

KEYWORDS: Cameras, Interference (communication), Image processing, Temperature metrology, Optical filters, CCD cameras, Image filtering, Charge-coupled devices, Black bodies, Thermography

Read Abstract +

Proceedings Article | 3 May 2004 Paper

CCD cameras as thermal imaging Devices in heat treatment processes

Gerald Zauner, Daniel Heim, Kurt Niel, Gunther Hendorfer, Herbert Stoeri

Proceedings Volume 5303, (2004) https://doi.org/10.1117/12.526339

KEYWORDS: Temperature metrology, Thermography, CCD cameras, Near infrared, Cameras, Imaging systems, Optical filters, Black bodies, Interference (communication), Charge-coupled devices

Read Abstract +

Proceedings Article | 22 May 2003 Paper

Temperature mapping in heat treatment processes with a standard color-video camera by means of image processing

Gerald Zauner, Daniel Heim, Gunther Hendorfer, Kurt Niel

Proceedings Volume 5011, (2003) https://doi.org/10.1117/12.477505

KEYWORDS: Image processing, Cameras, Temperature metrology, Visualization, Imaging systems, Image stacking, Image enhancement, Image visualization, CCD cameras, Image filtering

Read Abstract +

Showing 5 of 15 publications

Conference Committee Involvement (16)

Optics, Photonics and Digital Technologies for Imaging Applications VII

6 April 2022 | Strasbourg, France

Optics, Photonics and Digital Technologies for Imaging Applications VI

6 April 2020 | Online Only, France

Optics, Photonics and Digital Technologies for Imaging Applications

24 April 2018 | Strasbourg, France

Optics, Photonics and Digital Technologies for Imaging Applications

5 April 2016 | Brussels, Belgium

Image Processing: Machine Vision Applications VIII

10 February 2015 | San Francisco, California, United States

Optics, Photonics and Digital Technologies for Multimedia Applications

16 April 2014 | Brussels, Belgium

Image Processing: Machine Vision Applications VII

3 February 2014 | San Francisco, California, United States

Image Processing: Machine Vision Applications VI

5 February 2013 | Burlingame, California, United States

Optics, Photonics and Digital Technologies for Multimedia Applications

17 April 2012 | Brussels, Belgium

Image Processing: Machine Vision Applications V

25 January 2012 | Burlingame, California, United States

Image Processing: Machine Vision Applications IV

25 January 2011 | San Francisco Airport, California, United States

Optics, Photonics and Digital Technologies for Multimedia Applications

12 April 2010 | Brussels, Belgium

Wavelet Applications in Industrial Processing VII

18 January 2010 | San Jose, California, United States

Wavelet Applications in Industrial Processing VI

21 January 2009 | San Jose, California, United States

Wavelet Applications in Industrial Processing V

11 September 2007 | Boston, MA, United States

Wavelet Applications in Industrial Processing IV

2 October 2006 | Boston, Massachusetts, United States

Showing 5 of 16 Conference Committees

Keywords/Phrases

Search In:

Publication Years