The achromatic diffractive optical element (DOE) was numerically studied. The light intensity distribution in the focal plane was studied by the vectorial diffraction theory, then the radially symmetric DOE to enable broadband achromatic focusing with low sidelobe intensity ratios and uniform central intensities were optimized by the simulated annealing (SA) algorithm. The plane wave with wavelength of 486nm, 588nm, and 656nm were used in our optimization and numerical research. Three DOEs with 60, 80, and 100 transition points were obtained. Numerical results shown that the sidelobe intensity suppression ratios of focal spots of these wavelengths are all less than 0.12, the principal peaks’ intensities differences and spots’ sizes differences of these focal spots are all less than 5% and 10%, respectively. The designed DOEs were polarization insensitive.
To provide accurate three-dimensional (3-D) data for production and processing, 3-D surface measurement is always an essential step to the production of glass. Profilometry and Interferometry are traditional measurement apparatus, referring to different procedures. Although more precise, Interferometry cannot be used in milling procedure, owing to the scattering property of rough glass. While as a widely used Profilometry, Coordinate Measuring Machine (CMM) employs a probe for measuring by contacting surface directly. It should be noted that such a time-consuming machine is not practical for measuring large-sized rough glass, so a novel designed method called temporal speckle is introduced to a non-contact binocular 3-D measurement system for measuring. Specifically, N band-limited binary patterns are sequentially projected to rough glass from a pattern generation device, such patterns have been proved to depress scattering properties of rough surface. The whole binocular 3-D measurement system can finish a single measurement in one second with a standard deviation less than 73.44um. This system performs fast and accurate 3-D surface measurement for large-sized rough glass block.
KEYWORDS: 3D image processing, 3D displays, 3D metrology, Electronics, Cameras, Structured light, 3D modeling, Digital Light Processing, Eye, Computing systems
Three dimensional Identification Card, with its three-dimensional personal image displayed and stored for personal identification, is supposed be the advanced version of the present two-dimensional identification card in the future [1]. Three dimensional Identification Card means that there are three-dimensional optical techniques are used, the personal image on ID card is displayed to be three-dimensional, so we can see three dimensional personal face. The ID card also stores the three-dimensional face information in its inside electronics chip, which might be recorded by using two-channel cameras, and it can be displayed in computer as three-dimensional images for personal identification. Three-dimensional ID card might be one interesting direction to update the present two-dimensional card in the future. Three-dimension ID card might be widely used in airport custom, entrance of hotel, school, university, as passport for on-line banking, registration of on-line game, etc...
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.