Yong-Hyun Lim
at SK Hynix Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 3 April 2017 Paper
Proceedings Volume 10144, 1014409 (2017) https://doi.org/10.1117/12.2256715
KEYWORDS: Nanoimprint lithography, Overlay metrology, Optical alignment, Lithography, Semiconducting wafers, Distortion, Process control, Error analysis, Silicon, Semiconductor manufacturing

Proceedings Article | 21 March 2017 Paper
Wooyung Jung, Jungbin Cho, Eunhyuk Choi, Yonghyun Lim, Cheolkyu Bok, Masatoshi Tsuji, Kei Kobayashi, Takuya Kono, Tetsuro Nakasugi
Proceedings Volume 10144, 1014412 (2017) https://doi.org/10.1117/12.2257845
KEYWORDS: Particles, Semiconducting wafers, Nanoimprint lithography, Coating, Optical lithography, Logic, Manufacturing, Defect inspection, High volume manufacturing, Lithography, Ultraviolet radiation, Photoresist processing

Proceedings Article | 5 April 2012 Paper
Woo-Yung Jung, Yong-Hyun Lim, Shin-Ae Park, Sang-Joon Ahn, Ji-Hyun Lee, Jung-A Yoo, Seung-Ho Pyi, Jin-Woong Kim
Proceedings Volume 8324, 83242L (2012) https://doi.org/10.1117/12.916035
KEYWORDS: Semiconducting wafers, Critical dimension metrology, Overlay metrology, Photoresist processing, Carbon, Optical lithography, Temperature metrology, Semiconductors, Metrology, Wafer inspection

Proceedings Article | 16 April 2011 Paper
Yong-Hyun Lim, Jae-Doo Eom, Woo-Yung Jung, Min-Sik Jang, Byung-Seok Lee, Jin-Woong Kim
Proceedings Volume 7972, 79722W (2011) https://doi.org/10.1117/12.869936
KEYWORDS: Photoresist materials, Oxides, Silicon, Silicon films, Semiconducting wafers, Photoresist developing, Diffusion, Ions, Gases, Chemical reactions

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