Prof. Song Zhang
Professor at Purdue Univ
SPIE Involvement:
Conference Program Committee | Conference Chair | Editor | Author
Area of Expertise:
high-speed 3D sensing , 3D optical metrology , 3D data analysis , high-speed 3D imaging , 3D video compression
Websites:
Profile Summary

Prof. Song Zhang is a professor of mechanical engineering at Purdue University. Previously, he was an assistant and associate professor of mechanical engineering at Iowa State University from 2008 to 2014. He received his Ph.D. degree in mechanical engineering from Stony Brook University in 2005. His major research interests are high-speed 3D optical metrology, 3D optical sensing, 3D video processing, human and computer interaction, and virtual reality. Dr. Zhang has published over 200 research articles including more than 100 journal papers; two book; and holds 3 US patents. A number of his journal articles have been featured on their covers or highlighted by the journal societies. Dr. Zhang received the NSF CAREER award, Stony Brook University's 40 under Forty Alumni Awards, Iowa State University's Early Career Engineering Faculty Research Award, Purdue University's Early Career Research Excellence Award, Discovery in Mechanical Engineering Award, along with others. He serves as an associate editor for Journal of Optics and Lasers in Engineering, and a Technical Editor for IEEE/ASME Transactions on Mechatronics. He is a fellow of SPIE and OSA.
Publications (85)

Proceedings Article | 30 September 2024 Presentation + Paper
Liming Chen, Yuchen Yang, Song Zhang
Proceedings Volume 13135, 131350F (2024) https://doi.org/10.1117/12.3029868
KEYWORDS: 3D metrology, Fringe analysis, 3D image reconstruction, 3D modeling, 3D image processing, Imaging systems

Proceedings Article | 13 March 2024 Presentation + Paper
Proceedings Volume 12900, 1290007 (2024) https://doi.org/10.1117/12.3005047
KEYWORDS: Depth of field, Focus stacking, Imaging systems, 3D image processing, 3D metrology, 3D image reconstruction

Proceedings Article | 10 July 2023 Presentation
Proceedings Volume 12524, 1252405 (2023) https://doi.org/10.1117/12.2665965
KEYWORDS: Calibration, Structured light, Mathematical modeling, 3D modeling, 3D acquisition, Systems modeling, Projection systems, Optical testing, Industry, Detection and tracking algorithms

Proceedings Article | 16 June 2023 Presentation + Paper
Proceedings Volume 12524, 1252408 (2023) https://doi.org/10.1117/12.2666567
KEYWORDS: LIDAR, RGB color model, Cameras, Sensors, Image resolution, Imaging systems, Point clouds, Statistical analysis, Matrices, Interpolation

Proceedings Article | 16 June 2023 Presentation + Paper
Proceedings Volume 12524, 125240F (2023) https://doi.org/10.1117/12.2667819
KEYWORDS: Sensors, 3D image processing, Phase unwrapping, Fringe analysis

Proceedings Article | 15 June 2023 Presentation
Yuchen Yang, Song Zhang
Proceedings Volume 12524, 125240I (2023) https://doi.org/10.1117/12.2666653
KEYWORDS: Cameras, Imaging systems, 3D modeling, Structured light, Calibration, 3D acquisition, 3D image processing, Systems modeling, Projection systems, Optical testing

Proceedings Article | 15 June 2023 Presentation
Proceedings Volume 12524, 125240H (2023) https://doi.org/10.1117/12.2666554
KEYWORDS: Phase unwrapping, Fringe analysis, Phase shifts, Depth map, Stereoscopy, Phase shifting, Metrology, Discontinuities, Cameras

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12098, 120980A (2022) https://doi.org/10.1117/12.2618922
KEYWORDS: Calibration, 3D modeling, Systems modeling, Cameras, Imaging systems, Structured light, Projection systems, 3D metrology, Fringe analysis

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12098, 1209802 (2022) https://doi.org/10.1117/12.2622649
KEYWORDS: Calibration, 3D metrology, Cameras, Fringe analysis, Structured light, 3D acquisition, 3D modeling, Error analysis

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12098, 1209803 (2022) https://doi.org/10.1117/12.2622620
KEYWORDS: Digital image correlation, 3D metrology, Phase shifts, Fringe analysis, 3D image processing, 3D modeling

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12098, 1209805 (2022) https://doi.org/10.1117/12.2622830
KEYWORDS: Calibration, Projection systems, Cameras, Imaging systems, Phase shifting, Point spread functions, Fringe analysis, Detection and tracking algorithms, Reconstruction algorithms, Error analysis

Proceedings Article | 30 May 2022 Presentation
Proceedings Volume PC12098, PC1209802 (2022) https://doi.org/10.1117/12.2623036

Proceedings Article | 9 September 2021 Open Access Presentation + Paper
Proceedings Volume 11813, 118130V (2021) https://doi.org/10.1117/12.2567675
KEYWORDS: 3D video streaming, 3D video compression, Projection systems, 3D image processing, Image compression, Video compression, Video

Proceedings Article | 10 October 2020 Presentation + Paper
Proceedings Volume 11552, 1155210 (2020) https://doi.org/10.1117/12.2575190
KEYWORDS: 3D modeling, Structured light, Projection systems, Calibration, Imaging systems, Cameras, Mathematical modeling, Distortion

Proceedings Article | 21 August 2020 Presentation + Paper
Proceedings Volume 11490, 1149008 (2020) https://doi.org/10.1117/12.2567650
KEYWORDS: Calibration, 3D modeling, Cameras, Error analysis, Systems modeling, Imaging systems, Projection systems, 3D metrology, Structured light

Proceedings Article | 21 August 2020 Paper
Proceedings Volume 11490, 114900L (2020) https://doi.org/10.1117/12.2567673
KEYWORDS: 3D metrology, Calibration, 3D modeling, Fringe analysis

Proceedings Article | 18 May 2020 Presentation + Paper
Proceedings Volume 11397, 113970D (2020) https://doi.org/10.1117/12.2559119
KEYWORDS: Projection systems, Cameras, Distortion, Error analysis, Imaging systems, Calibration, Structured light, 3D modeling, Fringe analysis, Matrices

Proceedings Article | 10 March 2020 Presentation
Proceedings Volume 11294, 112940N (2020) https://doi.org/10.1117/12.2542748
KEYWORDS: 3D metrology, Projection systems, Micromirrors, Super resolution, Digital Light Processing, Digital micromirror devices, Cameras, Diamond, Optical testing, Stereoscopic cameras

SPIE Journal Paper | 13 February 2020
OE, Vol. 59, Issue 02, 024104, (February 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.2.024104
KEYWORDS: 3D metrology, Fringe analysis, 3D image processing, Cameras, Optical spheres, Binary data, Projection systems, 3D image reconstruction, Optical engineering, Video

Proceedings Article | 3 September 2019 Presentation + Paper
Proceedings Volume 11102, 1110208 (2019) https://doi.org/10.1117/12.2524923
KEYWORDS: 3D metrology, 3D image reconstruction, Fringe analysis, Cameras, 3D modeling, Projection systems, Binary data, Phase retrieval, 3D image processing, Stereoscopy

Proceedings Article | 13 May 2019 Presentation
Proceedings Volume 10991, 1099107 (2019) https://doi.org/10.1117/12.2517870
KEYWORDS: Fourier transforms, Fringe analysis, 3D metrology, Shape analysis, Bandpass filters, Phase shifts

Proceedings Article | 4 March 2019 Presentation + Paper
Proceedings Volume 10932, 109320F (2019) https://doi.org/10.1117/12.2511395
KEYWORDS: Phase shifts, Fringe analysis, 3D metrology, Error analysis, Projection systems, Motion estimation, Motion measurement, Calibration, Motion models

Proceedings Article | 14 May 2018 Presentation + Paper
Proceedings Volume 10667, 1066709 (2018) https://doi.org/10.1117/12.2309579
KEYWORDS: 3D metrology, Fringe analysis, Phase shifts, Double patterning technology

Proceedings Article | 14 May 2018 Presentation + Paper
Proceedings Volume 10667, 106670C (2018) https://doi.org/10.1117/12.2309575
KEYWORDS: Image compression, 3D image processing, Data storage, 3D metrology, Image storage

Proceedings Article | 14 May 2018 Presentation + Paper
Ziping Liu, Song Zhang
Proceedings Volume 10667, 1066707 (2018) https://doi.org/10.1117/12.2309576
KEYWORDS: Phase shifts, 3D metrology, Phase shifting, Error analysis, Motion estimation, 3D image processing, 3D modeling, Phase measurement

SPIE Journal Paper | 28 September 2017
OE, Vol. 56, Issue 09, 094114, (September 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.9.094114
KEYWORDS: Cameras, Projection systems, Imaging systems, 3D image reconstruction, Reconstruction algorithms, Phase shifts, 3D image processing, Embedded systems, Calibration, 3D metrology

SPIE Journal Paper | 6 July 2017
OE, Vol. 56, Issue 07, 074102, (July 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.7.074102
KEYWORDS: Binary data, Digital Light Processing, Projection systems, Optical testing, Projection devices, Fringe analysis

Proceedings Article | 4 May 2017 Paper
Proceedings Volume 10220, 1022009 (2017) https://doi.org/10.1117/12.2262564
KEYWORDS: Cameras, 3D metrology, Projection systems, Embedded systems, Phase measurement, Fringe analysis, Calibration, Metrology, 3D vision, Machine vision, Imaging systems, 3D modeling, Phase shifts, 3D image processing, Algorithm development

Proceedings Article | 4 May 2017 Paper
Proceedings Volume 10220, 1022004 (2017) https://doi.org/10.1117/12.2262572
KEYWORDS: Optical spheres, 3D modeling, Volume rendering, Fringe analysis, Projection devices

Proceedings Article | 1 May 2017 Paper
Yatong An, Song Zhang
Proceedings Volume 10220, 1022005 (2017) https://doi.org/10.1117/12.2262680
KEYWORDS: 3D metrology, Metrology, Calibration, Fringe analysis, Phase retrieval, 3D vision, Machine vision, Projection systems, Cameras, Structured light, Optical spheres, 3D image processing, Imaging systems, 3D modeling, 3D scanning

Proceedings Article | 20 February 2017 Paper
Proceedings Volume 10117, 1011707 (2017) https://doi.org/10.1117/12.2250698
KEYWORDS: Binary data, Digital Light Processing, Signal to noise ratio, 3D metrology, Micromirrors, Three dimensional sensing, Imaging systems, Metrology, Fringe analysis, Phase shifts, Phase measurement, Stereoscopy, Calibration

Proceedings Article | 28 August 2016 Presentation + Paper
Beiwen Li, Ziping Liu, Song Zhang
Proceedings Volume 9960, 99600K (2016) https://doi.org/10.1117/12.2236244
KEYWORDS: Fourier transforms, Phase shifts, Fringe analysis, Motion measurement, Cameras, 3D metrology, Error analysis, Projection systems, Francium, Binary data

Proceedings Article | 19 May 2016 Paper
Proceedings Volume 9868, 986803 (2016) https://doi.org/10.1117/12.2225225
KEYWORDS: Structured light, Image compression, Data compression, Computer programming, 3D image processing, Optical spheres, Image restoration, Data storage, Phase shifts, Cameras

Proceedings Article | 19 May 2016 Paper
Proceedings Volume 9868, 98680E (2016) https://doi.org/10.1117/12.2225227
KEYWORDS: 3D metrology, Fringe analysis, Cameras, High dynamic range imaging, Phase retrieval, 3D modeling, Phase shifts, Reconstruction algorithms, Quality measurement, Computer simulations

Proceedings Article | 17 July 2015 Paper
Proceedings Volume 9524, 95240J (2015) https://doi.org/10.1117/12.2186285
KEYWORDS: Binary data, Diffusion, Phase shifting, Gaussian filters, Phase shifts, Fringe analysis, Projection systems, Calibration, 3D metrology, Precision measurement

Proceedings Article | 14 May 2015 Paper
Proceedings Volume 9489, 948902 (2015) https://doi.org/10.1117/12.2179114
KEYWORDS: Image compression, Projection systems, Image quality, 3D image processing, Fringe analysis, Cameras, Data compression, RGB color model, Image storage, Sensors

Proceedings Article | 13 November 2014 Paper
Proceedings Volume 9276, 92760C (2014) https://doi.org/10.1117/12.2070799
KEYWORDS: Phase shifts, Optimization (mathematics), Binary data, Diffusion, Fringe analysis, 3D metrology, Phase shifting, Gaussian filters, Projection systems, Phase shift keying

Proceedings Article | 13 November 2014 Paper
Proceedings Volume 9276, 92760Q (2014) https://doi.org/10.1117/12.2071536
KEYWORDS: Projection systems, Digital Light Processing, LCDs, 3D metrology, Cameras, Polonium, 3D displays, Binary data, Fringe analysis, Phase shifts

SPIE Journal Paper | 14 October 2014 Open Access
OE, Vol. 53, Issue 11, 112201, (October 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.11.112201
KEYWORDS: 3D metrology, Optical metrology, Mechanical engineering, 3D applications, Robotics, Ocean optics, Optics manufacturing, Three dimensional sensing, Biometrics, 3D surface sensing

Proceedings Article | 18 August 2014 Paper
Proceedings Volume 9203, 920310 (2014) https://doi.org/10.1117/12.2060562
KEYWORDS: Phase shifts, 3D metrology, Fringe analysis, Modulators, Wavefronts, Optical fibers, Algorithm development, Modulation, Electro optics, Phase shift keying

Proceedings Article | 28 May 2014 Paper
Proceedings Volume 9110, 911002 (2014) https://doi.org/10.1117/12.2050534
KEYWORDS: Projection systems, Error analysis, Calibration, Fringe analysis, 3D metrology, Phase shifts, Cameras, Complex systems, Algorithm development, Phase shift keying

Proceedings Article | 28 May 2014 Paper
Proceedings Volume 9110, 911004 (2014) https://doi.org/10.1117/12.2050786
KEYWORDS: Digital Light Processing, Projection systems, Liquid crystal on silicon, 3D metrology, Cameras, Binary data, Signal to noise ratio, Quality measurement, Fringe analysis, Phase shifts

SPIE Journal Paper | 1 April 2014
OE, Vol. 53, Issue 11, 112206, (April 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.11.112206
KEYWORDS: 3D metrology, Projection systems, Binary data, 3D acquisition, Digital Light Processing, Digital micromirror devices, Optical metrology, 3D displays, Calibration, Phase shifts

Proceedings Article | 7 March 2014 Paper
Proceedings Volume 8979, 897907 (2014) https://doi.org/10.1117/12.2035270
KEYWORDS: 3D metrology, Projection systems, Digital Light Processing, Binary data, 3D acquisition, Cameras, 3D displays, Digital micromirror devices, Optical metrology, Phase shifts

SPIE Journal Paper | 18 February 2014
Nikolaus Karpinsky, Morgan Hoke, Vincent Chen, Song Zhang
OE, Vol. 53, Issue 02, 024105, (February 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.2.024105
KEYWORDS: 3D displays, 3D metrology, Graphics processing units, 3D acquisition, Cameras, Phase shifts, 3D image processing, Projection systems, Digital filtering, Gaussian filters

SPIE Journal Paper | 3 January 2014
OE, Vol. 53, Issue 01, 014102, (January 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.1.014102
KEYWORDS: Fringe analysis, Calibration, 3D metrology, Projection systems, Cameras, Phase shifts, Phase measurement, Optical engineering, Imaging systems, Quality measurement

Proceedings Article | 6 September 2013 Paper
Beiwen Li, John Gibson, Jill Middendorf, Yajun Wang, Song Zhang
Proceedings Volume 8839, 883908 (2013) https://doi.org/10.1117/12.2022225
KEYWORDS: Projection systems, Digital Light Processing, Liquid crystal on silicon, Fringe analysis, Cameras, 3D metrology, Mirrors, Polonium, Liquid crystals, Micromirrors

Proceedings Article | 6 September 2013 Paper
Proceedings Volume 8839, 883904 (2013) https://doi.org/10.1117/12.2022226
KEYWORDS: 3D metrology, Binary data, Fringe analysis, Projection systems, Gaussian filters, Phase shifts, Phase measurement, Quality measurement, Phase shift keying, Modulation

Proceedings Article | 6 September 2013 Paper
Nikolaus Karpinsky, Morgan Hoke, Vincent Chen, Song Zhang
Proceedings Volume 8839, 88390K (2013) https://doi.org/10.1117/12.2021655
KEYWORDS: 3D metrology, 3D modeling, Computing systems, 3D image processing, Cameras, 3D scanning, Phase shifting, Projection systems, 3D acquisition, Structured light

SPIE Journal Paper | 2 November 2012 Open Access
OE, Vol. 51, Issue 11, 113602, (November 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.11.113602
KEYWORDS: Binary data, Modulation, Fourier transforms, Projection systems, Fringe analysis, 3D metrology, Error analysis, Digital Light Processing, Optical engineering, 3D image processing

Proceedings Article | 13 September 2012 Paper
Proceedings Volume 8493, 849312 (2012) https://doi.org/10.1117/12.927439
KEYWORDS: Binary data, Modulation, 3D metrology, Fringe analysis, Fourier transforms, Projection systems, Gaussian filters, Quality measurement, Solids, Cameras

Proceedings Article | 13 September 2012 Paper
Song Zhang, Laura Ekstrand, Taylor Grieve, David Eisenmann, L. Scott Chumbley
Proceedings Volume 8493, 849310 (2012) https://doi.org/10.1117/12.930376
KEYWORDS: Computer graphics, Profilometers, Image resolution, Data processing, Denoising, Error analysis, 3D image processing, 3D displays, Optical spheres, 3D scanning

SPIE Journal Paper | 9 March 2012
Ying Xu, Song Zhang
OE, Vol. 51, Issue 02, 023604, (March 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.2.023604
KEYWORDS: Projection systems, Binary data, Cameras, Fringe analysis, Phase shift keying, Phase shifts, Calibration, Video, Error analysis, Optical engineering

Proceedings Article | 30 January 2012 Paper
Nikolaus Karpinsky, Song Zhang
Proceedings Volume 8290, 829012 (2012) https://doi.org/10.1117/12.907503
KEYWORDS: Computer programming, 3D video compression, Image compression, 3D image processing, Video, Optical spheres, Projection systems, Video compression, RGB color model, Video acceleration

SPIE Journal Paper | 1 December 2011
Laura Ekstrand, Song Zhang
OE, Vol. 50, Issue 12, 123603, (December 2011) https://doi.org/10.1117/12.10.1117/1.3662387
KEYWORDS: Projection systems, Cameras, 3D metrology, Reflectivity, 3D image processing, Fringe analysis, Binary data, Automatic exposure, Digital Light Processing, High dynamic range imaging

Proceedings Article | 14 September 2011 Paper
Ying Xu, Laura Ekstrand, Song Zhang
Proceedings Volume 8133, 81330M (2011) https://doi.org/10.1117/12.892362
KEYWORDS: 3D metrology, Projection systems, Binary data, Fringe analysis, Cameras, Phase shifts, Phase shift keying, Gaussian filters, Calibration, Error analysis

Proceedings Article | 10 September 2011 Paper
Laura Ekstrand, Song Zhang
Proceedings Volume 8133, 813305 (2011) https://doi.org/10.1117/12.892492
KEYWORDS: 3D metrology, Projection systems, Cameras, Reflectivity, Digital Light Processing, Fringe analysis, Binary data, Automatic exposure, Signal to noise ratio, Phase shifts

SPIE Journal Paper | 1 February 2011
OE, Vol. 50, Issue 02, 023603, (February 2011) https://doi.org/10.1117/12.10.1117/1.3534798
KEYWORDS: Projection systems, Cameras, 3D metrology, Fringe analysis, Binary data, Digital Light Processing, Phase shifts, Imaging systems, 3D acquisition, CCD cameras

Proceedings Article | 11 November 2010 Paper
Proceedings Volume 7855, 78550T (2010) https://doi.org/10.1117/12.870715
KEYWORDS: Projection systems, Fringe analysis, Binary data, 3D metrology, Calibration, Error analysis, Phase shifts, Cameras, Shape analysis, Digital Light Processing

Proceedings Article | 3 August 2010 Paper
Proceedings Volume 7790, 77901A (2010) https://doi.org/10.1117/12.860181
KEYWORDS: Projection systems, Binary data, Cameras, 3D metrology, Fringe analysis, Digital Light Processing, Phase shifts, 3D acquisition, CCD cameras, Imaging systems

Proceedings Article | 3 August 2010 Paper
Ji Li, Song Zhang
Proceedings Volume 7790, 77900B (2010) https://doi.org/10.1117/12.860179
KEYWORDS: Projection systems, 3D metrology, Fringe analysis, Digital Light Processing, Binary data, Mirrors, Solid state electronics, Micromirrors, Motion measurement, Digital micromirror devices

SPIE Journal Paper | 1 June 2010
Nikolaus Karpinsky, Song Zhang
OE, Vol. 49, Issue 06, 063604, (June 2010) https://doi.org/10.1117/12.10.1117/1.3456632
KEYWORDS: 3D image processing, Image compression, Phase shifts, Projection systems, Composites, Image restoration, Data storage, Cameras, Optical engineering, Stereoscopy

Proceedings Article | 15 April 2010 Paper
Nikolaus Karpinsky, Shuangyan Lei, Song Zhang
Proceedings Volume 7522, 75220E (2010) https://doi.org/10.1117/12.851484
KEYWORDS: 3D metrology, Projection systems, 3D acquisition, Cameras, Calibration, Fringe analysis, 3D image processing, Algorithm development, Phase shifts, Data acquisition

SPIE Journal Paper | 1 October 2009
OE, Vol. 48, Issue 10, 105601, (October 2009) https://doi.org/10.1117/12.10.1117/1.3251280
KEYWORDS: Phase shifts, Signal to noise ratio, Error analysis, Optical engineering, Gaussian filters, Cameras, Projection systems, Reflectivity, Phase shift keying, Denoising

Proceedings Article | 10 September 2009 Paper
Proceedings Volume 7432, 74320N (2009) https://doi.org/10.1117/12.823903
KEYWORDS: Phase shifts, 3D metrology, Algorithm development, Projection systems, Cameras, Signal to noise ratio, Phase shift keying, Photography, Reconstruction algorithms, Phase shifting

Proceedings Article | 10 September 2009 Paper
Proceedings Volume 7432, 743202 (2009) https://doi.org/10.1117/12.823829
KEYWORDS: Calibration, Projection systems, Cameras, Imaging systems, Phase shifts, 3D metrology, Distortion, Corner detection, Phase shifting, Structured light

Proceedings Article | 22 May 2009 Paper
L. S. Chumbley, D. J. Eisenmann, M. Morris, S. Zhang, J. Craft, C. Fisher, A. Saxton
Proceedings Volume 7378, 73782D (2009) https://doi.org/10.1117/12.825185
KEYWORDS: Profilometers, Forensic science, Manufacturing, Statistical analysis, Surface roughness, 3D scanning, Lead, Radium, Standards development, Data processing

SPIE Journal Paper | 1 March 2009
Song Zhang, Shing-Tung Yau
OE, Vol. 48, Issue 03, 033604, (March 2009) https://doi.org/10.1117/12.10.1117/1.3099720
KEYWORDS: Reflectivity, Phase shifts, High dynamic range imaging, Cameras, 3D metrology, 3D image processing, Projection systems, Phase retrieval, Algorithm development, Modulation

SPIE Journal Paper | 1 December 2008
Song Zhang, Shing-Tung Yau
OE, Vol. 47, Issue 12, 123604, (December 2008) https://doi.org/10.1117/12.10.1117/1.3046715
KEYWORDS: Cameras, 3D metrology, 3D image processing, 3D acquisition, Projection systems, Imaging systems, Optical filters, Phase shifts, Calibration, Fringe analysis

Proceedings Article | 29 August 2008 Paper
Song Zhang, Shing-Tung Yau
Proceedings Volume 7066, 70660A (2008) https://doi.org/10.1117/12.791265
KEYWORDS: Reflectivity, Cameras, 3D metrology, High dynamic range imaging, Phase shifts, Projection systems, Modulation, Phase retrieval, Phase shift keying, 3D image processing

Proceedings Article | 11 August 2008 Paper
Song Zhang, Shing-Tung Yau
Proceedings Volume 7063, 70630M (2008) https://doi.org/10.1117/12.792003
KEYWORDS: Cameras, Optical filters, 3D acquisition, 3D image processing, Projection systems, 3D metrology, Phase shifts, Imaging systems, Volume rendering, Image filtering

SPIE Journal Paper | 1 March 2008
Song Zhang, Shing-Tung Yau
OE, Vol. 47, Issue 03, 033608, (March 2008) https://doi.org/10.1117/12.10.1117/1.2898902
KEYWORDS: 3D metrology, 3D image processing, Projection systems, Cameras, Imaging systems, Phase shifts, Optical engineering, Visualization, Fringe analysis, Sensors

SPIE Journal Paper | 1 January 2008
Song Zhang, Shing-Tung Yau
OE, Vol. 47, Issue 01, 013604, (January 2008) https://doi.org/10.1117/12.10.1117/1.2835686
KEYWORDS: Cameras, Imaging systems, Calibration, Projection systems, 3D image processing, 3D metrology, 3D modeling, Optical engineering, Nose, Structured light

SPIE Journal Paper | 1 November 2007
Song Zhang, Shing-Tung Yau
OE, Vol. 46, Issue 11, 113603, (November 2007) https://doi.org/10.1117/12.10.1117/1.2802546
KEYWORDS: Phase shifts, 3D metrology, Motion measurement, Cameras, 3D image processing, Calibration, Projection systems, Mouth, Algorithm development, 3D acquisition

Proceedings Article | 26 September 2007 Paper
Song Zhang, Shing-Tung Yau
Proceedings Volume 6762, 676209 (2007) https://doi.org/10.1117/12.741459
KEYWORDS: 3D metrology, 3D image processing, Projection systems, Cameras, Imaging systems, Phase shifts, Fringe analysis, Data acquisition, Visualization, Sensors

SPIE Journal Paper | 1 June 2007
OE, Vol. 46, Issue 06, 063601, (June 2007) https://doi.org/10.1117/12.10.1117/1.2746814
KEYWORDS: Projection systems, 3D metrology, Error analysis, Fringe analysis, Phase shifts, Volume rendering, Cameras, Phase measurement, 3D image processing, Optical engineering

SPIE Journal Paper | 1 December 2006
OE, Vol. 45, Issue 12, 123601, (December 2006) https://doi.org/10.1117/12.10.1117/1.2402128
KEYWORDS: 3D acquisition, 3D image processing, Reconstruction algorithms, 3D metrology, Projection systems, Cameras, Phase shifts, 3D displays, 3D modeling, Algorithm development

Proceedings Article | 14 August 2006 Paper
Song Zhang, Shing-Tung Yau
Proceedings Volume 6292, 62920R (2006) https://doi.org/10.1117/12.678150
KEYWORDS: Projection systems, Phase shifts, Error analysis, 3D metrology, Calibration, Cameras, Video, Fringe analysis, Algorithm development, Reflectivity

Proceedings Article | 14 August 2006 Paper
Song Zhang, Dale Royer, Shing-Tung Yau
Proceedings Volume 6292, 62920M (2006) https://doi.org/10.1117/12.677343
KEYWORDS: 3D metrology, Phase shifts, Projection systems, 3D acquisition, Calibration, Volume rendering, 3D image processing, Cameras, 3D image reconstruction, Algorithm development

SPIE Journal Paper | 1 August 2006
OE, Vol. 45, Issue 08, 083601, (August 2006) https://doi.org/10.1117/12.10.1117/1.2336196
KEYWORDS: Calibration, Cameras, Projection systems, Digital micromirror devices, Imaging systems, Charge-coupled devices, 3D metrology, Optical engineering, Fringe analysis, Structured light

SPIE Journal Paper | 1 December 2005
Peisen Huang, Song Zhang, Fu-Pen Chiang
OE, Vol. 44, Issue 12, 123601, (December 2005) https://doi.org/10.1117/12.10.1117/1.2147311
KEYWORDS: Phase shifts, 3D metrology, Fringe analysis, Optical engineering, Image resolution, Projection systems, 3D acquisition, Cameras, 3D modeling, Structured light

Proceedings Article | 8 November 2005 Paper
Proceedings Volume 6000, 600002 (2005) https://doi.org/10.1117/12.631766
KEYWORDS: 3D metrology, Projection systems, Phase shifts, Calibration, Cameras, 3D acquisition, 3D displays, Fringe analysis, 3D modeling, Reconstruction algorithms

Proceedings Article | 7 November 2005 Paper
Proceedings Volume 6000, 60000F (2005) https://doi.org/10.1117/12.631259
KEYWORDS: 3D metrology, Algorithm development, Phase shifts, 3D image processing, Phase shifting, Error analysis, Fringe analysis, Detection and tracking algorithms, Image processing, Reconstruction algorithms

Proceedings Article | 7 November 2005 Paper
Proceedings Volume 6000, 60000E (2005) https://doi.org/10.1117/12.631256
KEYWORDS: Projection systems, 3D metrology, Fringe analysis, Phase shifts, Volume rendering, Error analysis, Cameras, Image quality, Calibration, Video

Proceedings Article | 16 December 2004 Paper
Peisen Huang, Song Zhang, Fu-Pen Chiang
Proceedings Volume 5606, (2004) https://doi.org/10.1117/12.573352
KEYWORDS: 3D metrology, Phase shifts, 3D modeling, Control systems, Inspection, 3D vision, Metrology, Digital Light Processing, Projection systems, Structured light

Showing 5 of 85 publications
Proceedings Volume Editor (16)

Showing 5 of 16 publications
Conference Committee Involvement (46)
Applied Optical Metrology VI
3 August 2025 | San Diego, California, United States
Optical Technology and Measurement for Industrial Applications Conference
21 April 2025 | Yokohama, Japan
Dimensional Optical Metrology and Inspection for Practical Applications XIV
16 April 2025 | Orlando, Florida, United States
Emerging Digital Micromirror Device Based Systems and Applications XVII
28 January 2025 | San Francisco, California, United States
Interferometry and Structured Light 2024
21 August 2024 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Emerging Digital Micromirror Device Based Systems and Applications XVI
30 January 2024 | San Francisco, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications XII
2 May 2023 | Orlando, Florida, United States
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Emerging Digital Micromirror Device Based Systems and Applications XV
30 January 2023 | San Francisco, California, United States
Interferometry XXI
24 August 2022 | San Diego, California, United States
Optical Technology and Measurement for Industrial Applications Conference 2022
18 April 2022 | Yokohama, Japan
Dimensional Optical Metrology and Inspection for Practical Applications XI
5 April 2022 | Orlando, Florida, United States
Emerging Digital Micromirror Device Based Systems and Applications XIV
25 January 2022 | San Francisco, California, United States
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Online, Japan
Dimensional Optical Metrology and Inspection for Practical Applications X
12 April 2021 | Online Only, Florida, United States
Emerging Digital Micromirror Device Based Systems and Applications XIII
6 March 2021 | Online Only, California, United States
Interferometry XX
24 August 2020 | Online Only, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Emerging Digital Micromirror Device Based Systems and Applications XII
4 February 2020 | San Francisco, California, United States
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, MD, United States
Emerging Digital Micromirror Device Based Systems and Applications XI
5 February 2019 | San Francisco, California, United States
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Interferometry XIX
21 August 2018 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, FL, United States
Emerging Digital Micromirror Device Based Systems and Applications X
30 January 2018 | San Francisco, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, CA, United States
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, MD, United States
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, MD, United States
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications III
5 May 2014 | Baltimore, MD, United States
Dimensional Optical Metrology and Inspection for Practical Applications II
25 August 2013 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications II
5 November 2012 | Beijing, China
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications
22 August 2011 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications
18 October 2010 | Beijing, China
Interferometry XV: Techniques and Analysis
2 August 2010 | San Diego, California, United States
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Interferometry XIV: Techniques and Analysis
11 August 2008 | San Diego, California, United States
Showing 5 of 46 Conference Committees
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