Absolute phase unwrapping via depth from focus in microscopic fringe projection profilometry

Song Zhang; Liming Chen

doi:10.1117/12.2666554

15 June 2023 Absolute phase unwrapping via depth from focus in microscopic fringe projection profilometry

Song Zhang, Liming Chen

Proceedings Volume 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII ; 125240H (2023) https://doi.org/10.1117/12.2666554
Event: SPIE Defense + Commercial Sensing, 2023, Orlando, Florida, United States

Abstract

This paper presents a novel phase unwrapping algorithm via depth from focus method in microscopic fringe projection profilometry. The proposed method uses fringe contrast to estimate the rough depth information and determines the fringe orders by geometrical constraint relationships. As a result, it does not require extra patterns or images, enabling a higher 3D imaging speed. Experimental results demonstrate that the proposed method can successfully realize phase unwrapping in microscopic fringe projection profilometry.

Conference Presentation

Citation Download Citation

Song Zhang and Liming Chen "Absolute phase unwrapping via depth from focus in microscopic fringe projection profilometry", Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 125240H (15 June 2023); https://doi.org/10.1117/12.2666554

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