Dr. Samir Bhamidipati
at Siemens EDA
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 April 2024 Poster + Paper
Sanghyun Choi, Qian Xie, Nathan Greeneltch, Hyung Joo Lee, Mohan Govindaraj, Srividya Jayaram, Mark Pereira, Sayani Biswas, Samir Bhamidipati, Ilhami Torunoglu
Proceedings Volume 12955, 129553M (2024) https://doi.org/10.1117/12.3012184
KEYWORDS: Education and training, Scanning electron microscopy, Data modeling, Performance modeling, Defect detection, Machine learning, Object detection, Semiconducting wafers, Image analysis, Image quality

Proceedings Article | 5 October 2023 Paper
Proceedings Volume 12802, 1280208 (2023) https://doi.org/10.1117/12.2680884
KEYWORDS: Contour extraction, Scanning electron microscopy, Image quality, Deep learning, Denoising, Image processing, Data modeling, Image denoising, Defect detection

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