Dr. Pei-Shiang Chen
Team Member at Taiwan Semiconductor Manufacturing Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 March 2015 Paper
Proceedings Volume 9423, 942310 (2015) https://doi.org/10.1117/12.2085100
KEYWORDS: Distortion, Thermal effects, Semiconducting wafers, Silicon carbide, Silicon, Finite element methods, Scattering, Thermal modeling, Electron beam lithography, Scanners

Proceedings Article | 4 April 2011 Paper
Proceedings Volume 7970, 79700Z (2011) https://doi.org/10.1117/12.869896
KEYWORDS: Raster graphics, Critical dimension metrology, Semiconducting wafers, Data transmission, Electron beam lithography, Tolerancing, Optical fibers, Maskless lithography, Electron beam direct write lithography, Mask making

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