Mohamed Yaseen Noor
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 24 November 2023 Presentation
Proceedings Volume PC12726, PC127260Q (2023) https://doi.org/10.1117/12.2684484
KEYWORDS: Laser irradiation, Fluoride, Calcium, Femtosecond phenomena, Ultrafast phenomena, Surface finishing, High power lasers, Crystals, Thermal deformation, Rectangular pulse

Proceedings Article | 24 November 2023 Poster
Conrad Kuz, Justin Twardowski, Parker Vaughan, Emma DeAngelis, Mohammad Mahafuzur Rahaman, Mohamed Yaseen Noor, Enam Chowdhury
Proceedings Volume PC12726, PC127261C (2023) https://doi.org/10.1117/12.2685247
KEYWORDS: Bessel beams, Glasses, Femtosecond phenomena, Laser cutting, Ablation, Reproducibility, Laser processing, Wet etching, Thermal effects, Scanning electron microscopy

Proceedings Article | 24 November 2023 Presentation
Proceedings Volume PC12726, PC127260K (2023) https://doi.org/10.1117/12.2685130
KEYWORDS: Multilayers, Crystals, Ultrafast lasers, Laser crystals, Dielectric mirrors, Transmission electron microscopy, Laser irradiation, Ultrafast phenomena, Laser systems engineering, Laser optics

Proceedings Article | 24 November 2023 Presentation
Liam Clink, Zhihan Li, Mohamed Yaseen Noor, Jay Gupta, Enam Chowdhury
Proceedings Volume PC12726, PC127260P (2023) https://doi.org/10.1117/12.2685023
KEYWORDS: Vacuum, Ultrafast lasers, Silicon, Semiconductor lasers, Scanning tunneling microscopy, Laser processing, Laser induced damage, Surface properties, Semiconductors, Pulsed laser operation

Proceedings Article | 3 December 2022 Poster + Presentation
Proceedings Volume PC12300, PC1230013 (2022) https://doi.org/10.1117/12.2642771
KEYWORDS: Wide bandgap semiconductors, Laser damage threshold, Ultrafast lasers, Surface plasmons, Silicon carbide, Atomic force microscopy, Oxides, Optical microscopy, Microscopy, Laser induced damage

Showing 5 of 8 publications
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