Novel method for detecting ultrafast laser induced sub-damage threshold defect accumulation in wide bandgap semiconductors

Emma DeAngelis; Mohamed Yaseen; Conrad Kuz; Enam Chowdhury

doi:10.1117/12.2642771

2 December 2022 Novel method for detecting ultrafast laser induced sub-damage threshold defect accumulation in wide bandgap semiconductors

Emma DeAngelis, Mohamed Yaseen, Conrad Kuz, Enam Chowdhury

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Proceedings Volume PC12300, Laser-Induced Damage in Optical Materials 2022; PC1230013 (2022) https://doi.org/10.1117/12.2642771
Event: SPIE Laser Damage, 2022, Rochester, New York, United States

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Abstract

This conference presentation was prepared for the Laser Damage conference in 2022.

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Emma DeAngelis, Mohamed Yaseen, Conrad Kuz, and Enam Chowdhury "Novel method for detecting ultrafast laser induced sub-damage threshold defect accumulation in wide bandgap semiconductors", Proc. SPIE PC12300, Laser-Induced Damage in Optical Materials 2022, PC1230013 (2 December 2022); https://doi.org/10.1117/12.2642771

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