Dr. Michael Wahl
at Univ Siegen
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 April 2023 Poster + Paper
Rebecca Busch, Michael Wahl, Bhaskar Choubey
Proceedings Volume 12496, 124963K (2023) https://doi.org/10.1117/12.2663153
KEYWORDS: Semiconducting wafers, Machine learning, Semiconductor manufacturing, Wafer testing, Neural networks, Process control, Artificial intelligence, Analytical research, Data processing, Random forests

Proceedings Article | 2 January 2018 Paper
K. Hahn, M. Wahl, R. Busch, A. Grünewald, R. Brück
Proceedings Volume 10456, 1045653 (2018) https://doi.org/10.1117/12.2282355
KEYWORDS: Manufacturing, Electronics, Microelectromechanical systems, Clouds, Databases, 3D modeling, Sensors, Microelectronics, Process modeling, Microtechnology

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