Meng-Fu You
at National Taiwan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 March 2007 Paper
Proceedings Volume 6521, 65210W (2007) https://doi.org/10.1117/12.711850
KEYWORDS: Transistors, Optical proximity correction, Device simulation, Image segmentation, Critical dimension metrology, Semiconducting wafers, Lithography, Resolution enhancement technologies, Manufacturing, Design for manufacturability

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