The demand for large coated flat and curved optics is growing for applications in automotive (windshields, LIDAR windows) or space (spectrally resolved imaging, FSO Lasercom). Their large size leading to high Transmitted wavefront error (TWE) and their sensitivity to wavelength require new metrology instruments. We propose measuring the TWE of such optics with a quadriwave lateral shearing interferometer (QLSI) based wave front sensor, in a double-pass configuration. We present the instrument ability to measure optics in their full transmission spectral band. We also discuss the best strategy to characterize large TWE optics in dynamic ranges exceeding tens of microns.
Smartphones, AR/VR and ADAS optics are challenging to qualify due to their short focal length, high chief ray angle and numerical aperture. Wave front sensing measures the optical aberration and the associated Zernike coefficients, which are used to understand manufacturing errors. In this paper, we propose to use a quadriwave lateral shearing wave front sensor, which is able to characterize such samples without any intermediate optics. This configuration makes the qualification process comprehensive and fast. We will present examples of commercial and calibrated optics with CRA larger than 35°.
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