Smartphones, AR/VR and ADAS optics are challenging to qualify due to their short focal length, high chief ray angle and numerical aperture. Wave front sensing measures the optical aberration and the associated Zernike coefficients, which are used to understand manufacturing errors. In this paper, we propose to use a quadriwave lateral shearing wave front sensor, which is able to characterize such samples without any intermediate optics. This configuration makes the qualification process comprehensive and fast. We will present examples of commercial and calibrated optics with CRA larger than 35°.
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