Jung Hoon Park
at Samsung Electronics Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 30 October 2007 Paper
Proceedings Volume 6730, 67302Z (2007) https://doi.org/10.1117/12.746810
KEYWORDS: Etching, Critical dimension metrology, Chromium, Photomasks, Curium, Ions, Electron beams, Plasma etching, Photoresist processing, Information operations

Proceedings Article | 15 May 2007 Paper
Proceedings Volume 6607, 660725 (2007) https://doi.org/10.1117/12.728988
KEYWORDS: Mask making, Photomasks, Electron beam lithography, Monte Carlo methods, Control systems, Optical proximity correction, Electron beams, Laser scattering, Scattering, Backscatter

Proceedings Article | 24 June 2005 Paper
So Young Kim, Sang Rae Lee, Jung Hoon Park, Yu Mi Sohn, Seung Ran Park
Proceedings Volume 5960, 59606K (2005) https://doi.org/10.1117/12.633512
KEYWORDS: Chromium, Color prediction, Video, Video compression, Video coding, Image compression, Image processing, Computer simulations, Lead, Video processing

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