Juan Sebastian Useche Parra
at FMF - Freiburger Materialforschungszentrum
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 August 2021 Presentation
Julian Fey, Michael Schuetz, Simon Procz, Sebastian Useche, Michael Fiederle
Proceedings Volume 11838, 118380Y (2021) https://doi.org/10.1117/12.2596375
KEYWORDS: Contamination, Signal to noise ratio, Sensors, Tungsten, Spatial resolution, X-rays, Spectroscopy, Silicon, Semiconductors, Semiconductor materials

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