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Dr. Hyun Jong Kim
at Korea Research Institute of Standards and Science
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Publications (4)
Proceedings Article | 15 October 2004 Paper
Azimuth calibration method in ellipsometer with imaging spectrograph
Proceedings Volume 5546, (2004) https://doi.org/10.1117/12.559382
KEYWORDS: Spectrographs, Calibration, Imaging spectroscopy, Ellipsometry, Sensors, Polarization, Signal detection, Optical testing, Spectroscopy, Thin films
Proceedings Article | 14 October 2004 Paper
Determination of optical properties of titanium dioxide thin films on different substrates by using spectroscopic ellipsometry
Proceedings Volume 5538, (2004) https://doi.org/10.1117/12.559427
KEYWORDS: Refractive index, Thin films, Silicon, Silicon films, Optical properties, Crystals, Spectroscopic ellipsometry, Dispersion, Thin film growth, Titanium dioxide
Proceedings Article | 1 July 2003 Paper
Noninvasive electrical characterization of semiconductor at bulk and interfaces
Regis Vanderhaghen, Samir Kasouit, Bernard Drevillon, Virginia Chu, Joao Conde, Hyunjong Kim, Jean Paul Kleider
Proceedings Volume 4999, (2003) https://doi.org/10.1117/12.482505
KEYWORDS: Interfaces, Silicon, Semiconductors, Diffusion, Microwave radiation, Ellipsometry, Ultraviolet radiation, Pulsed laser operation, Thin films, Crystals
Proceedings Article | 21 May 2002 Paper
Noninvasive electrical characterization of semiconductor and interface
Samir Kasouit, Bernard Drevillon, Joao Conde, Hyun Jong Kim, Jean Paul Kleider, Regis Vanderhaghen
Proceedings Volume 4650, (2002) https://doi.org/10.1117/12.467666
KEYWORDS: Interfaces, Semiconductors, Microwave radiation, Diffusion, Silicon, Ellipsometry, Thin films, Pulsed laser operation, Silicon films, Crystals
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