Dr. Gökay Yeğen
at ASML Netherlands BV
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 27 May 2021
JM3, Vol. 20, Issue 02, 021005, (May 2021) https://doi.org/10.1117/12.10.1117/1.JMM.20.2.021005
KEYWORDS: Pellicles, Scanners, Extreme ultraviolet, Extreme ultraviolet lithography, Carbon nanotubes, Semiconducting wafers, Scattering, Reticles, Particles, Line width roughness

Proceedings Article | 23 February 2021 Presentation + Paper
Proceedings Volume 11609, 116090Z (2021) https://doi.org/10.1117/12.2584724

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