Paper
1 January 1992 Mass spectrometric and optical emission diagnostics for rf plasma reactors
James K. Olthoff, James R. Roberts, R. J. Van Brunt, James R. Whetstone, Mark A. Sobolewski, S. Djurovic
Author Affiliations +
Proceedings Volume 1594, Process Module Metrology, Control and Clustering; (1992) https://doi.org/10.1117/12.56630
Event: Microelectronic Processing Integration, 1991, San Jose, CA, United States
Abstract
Mass spectrometric and optical emission studies have been performed on argon discharges in a GEC rf reference reactor. Kinetic-energy distributions for ions produced in the sheath region are broad and exhibit structure, while ions produced in the bulk plasma exhibit narrow, featureless energy distributions. The addition of small amounts of O2 to an argon discharge significantly alters the observed positive-ion kinetic- energy distributions. Optical emission studies indicate increasing spatial non-uniformity in the plasma at higher pressures. Time-resolved optical emission studies indicate a varying relationship between the applied rf voltage and the time-varying optical emission with changing pressure and position between the electrodes.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James K. Olthoff, James R. Roberts, R. J. Van Brunt, James R. Whetstone, Mark A. Sobolewski, and S. Djurovic "Mass spectrometric and optical emission diagnostics for rf plasma reactors", Proc. SPIE 1594, Process Module Metrology, Control and Clustering, (1 January 1992); https://doi.org/10.1117/12.56630
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Cited by 2 scholarly publications.
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KEYWORDS
Plasma

Electrodes

Ions

Argon

Process control

Spectroscopy

Oxygen

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