Paper
1 July 1991 Origins of asymmetry in spin-cast films over topography
Loni M. Manske, David B. Graves
Author Affiliations +
Abstract
A pulsed laser, a microscope, and a 35-mm camera are used to stroboscopically create and image interference fringes around surface features during spin coating. The measured film thickness profiles are compared to predictions from a lubrication model. This model has been extended to two dimensions so that the surface contours around features of any width and length may be calculated, and preliminary results are reported. Profile asymmetry, or 'pile- up,' is caused by surface tension forces near the edges of the feature that accelerate flow where the channel (the film thickness) narrows and retard flow where the film thickness widens.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Loni M. Manske and David B. Graves "Origins of asymmetry in spin-cast films over topography", Proc. SPIE 1463, Optical/Laser Microlithography IV, (1 July 1991); https://doi.org/10.1117/12.44800
Lens.org Logo
CITATIONS
Cited by 5 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Capillaries

Semiconducting wafers

Coating

Microfluidics

Optical lithography

Solids

Interferometry

RELATED CONTENT

Pattern collapse solution for asymmetric pattern
Proceedings of SPIE (March 27 2017)
Evaluation of resist-film property for CD control
Proceedings of SPIE (July 24 2002)
Culture-based biochip for environmental monitoring
Proceedings of SPIE (December 23 2003)
Planarization of spin-coated films
Proceedings of SPIE (June 01 1992)

Back to Top