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Dr. Jiqiang Zhou
at Changchun Univ of Science and Technology
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Publications (1)
Proceedings Article | 20 February 2018 Paper
Testing system of multiplying electron gain for electron bombarded semiconductor
Jiqiang Zhou, Haibo Fan, Hongcang Cheng, Yining Mu, De Song
Proceedings Volume 10697, 106970T (2018) https://doi.org/10.1117/12.2309747
KEYWORDS: Semiconductors, Signal detection, Amplifiers, Resistors, Scattering, Ionization, Silicon, Image processing, Capacitance, Interference (communication)
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