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Dr. Zengwen Xiao
at Harbin Institute of Technology
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Author
Publications (1)
Proceedings Article | 9 February 2005 Paper
Analysis of AFM vibrating nanotube tip imaging
ZengWen Xiao, Xuezeng Zhao
Proceedings Volume 5635, (2005) https://doi.org/10.1117/12.576326
KEYWORDS: Atomic force microscopy, Semiconductors, Scanning electron microscopy, Atomic force microscope, Carbon nanotubes, Precision measurement, Photography, Electron microscopes, Mathematical morphology, Metrology
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