Dr. Yanpeng Cao
at Mtech Imaging Pte Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 June 2013 Paper
Proceedings Volume 8704, 87042W (2013) https://doi.org/10.1117/12.2015641
KEYWORDS: Nonuniformity corrections, Staring arrays, Calibration, Temperature metrology, Long wavelength infrared, Thermography, Infrared imaging, Imaging systems, Image processing, Infrared radiation

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