Dr. Yang Wu
Product Characterization Engineer at Himax Imaging Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 January 2009 Paper
Yang Wu, Philip Cizdziel, Howard Rhodes
Proceedings Volume 7250, 725004 (2009) https://doi.org/10.1117/12.805743
KEYWORDS: Quantum efficiency, Silicon, Optical filters, Signal to noise ratio, Sensors, CMOS sensors, Electrons, Photons, Signal processing, Back end of line

Proceedings Article | 18 September 2007 Paper
Proceedings Volume 6668, 66680O (2007) https://doi.org/10.1117/12.729197
KEYWORDS: CMOS sensors, Diffraction, Back end of line, Free space, Silicon, Spherical lenses, Matrices, Geometrical optics, Interfaces, Copper indium disulfide

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