Yan Yu
at Chongqing Institute of Metrology And Quality Inspection
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 December 2019 Paper
Sen Zhou, Jian Xu, Tao Lei, Yan Yu, Yingqian Ni
Proceedings Volume 11338, 113380P (2019) https://doi.org/10.1117/12.2542069
KEYWORDS: Sensors, Standards development, Calibration, Laser scanners, Inspection, Imaging systems, 3D metrology, Metrology, Optical sensors, Laser development

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