Laser-induced damage threshold is an important parameter to evaluate the performance of the optical components in high power laser systems. An automated test system is presented to measure multiwavelength laser-induced damage threshold. The presented system can be able to operate the 1-on-1 and R-on-1 methodologies at 1064nm, 532nm, and 355nm. Some solutions are presented to improve the measurement efficiency and the reliability. Experimental results are also provided to confirm the capabilities of the proposed test system.
This work presents the influence of polarization orientation on bulk damage performance of type I doubler KDP crystals under different wavelengths pulses exposure. Pinpoints densities (PPD) and the size distribution of pinpoints are extracted through light scattering pictures. The obtained results strongly indicate that the measured PPD as a function of the fluence are both wavelength and polarization orientation related, while neither fluence nor polarization orientation affect the size distribution of pinpoints. We also find that the bulk damage characteristics can divide into three sorts with respect to the wavelength, suggesting the existence of different species of precursors and different mechanisms responsible for bulk damage initiation in SHG KDP crystals.
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