Dr. Uwe Apel
at Robert Bosch GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 June 2017 Paper
Proceedings Volume 10334, 1033404 (2017) https://doi.org/10.1117/12.2271975
KEYWORDS: Modulation transfer functions, Cameras, Imaging systems, Inspection, CMOS sensors, Sensors, Image sensors, Standards development, Manufacturing, Detection and tracking algorithms, Chromatic aberrations, Edge detection, Error analysis

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