Toshihide Kikkawa
at Fujitsu Labs Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 February 2008 Paper
T. Kikkawa, K. Imanishi, N. Hara, H. Shigematsu, K. Joshin
Proceedings Volume 6894, 68941Q (2008) https://doi.org/10.1117/12.772152
KEYWORDS: Gallium nitride, Field effect transistors, Amplifiers, Reliability, Telecommunications, Silicon carbide, Wireless communications, Electrodes, Electronic components, Failure analysis

Conference Committee Involvement (2)
Gallium Nitride Materials and Devices V
25 January 2010 | San Francisco, California, United States
Gallium Nitride Materials and Devices IV
26 January 2009 | San Jose, California, United States
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