Dr. Tianyu Zhang
at Shanghai Institute of Optics & Fine Mechanics CAS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 December 2022 Paper
Proceedings Volume 12478, 124784F (2022) https://doi.org/10.1117/12.2654953
KEYWORDS: Refractive index, Diagnostics, Ultrafast phenomena, Kerr effect, Charge-coupled devices, Time metrology, Signal detection, Plasma, Picosecond phenomena, Oscilloscopes

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