Takuya Ishii
at Gigaphoton Inc
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 10 April 2024 Poster + Paper
Fumio Iwamoto, Yoshifumi Ueno, Shinji Nagai, Kenichi Miyao, Hideyuki Hayashi, Takuya Ishii, Tamotsu Abe, Hiroaki Nakarai, Takashi Saito
Proceedings Volume 12953, 1295313 (2024) https://doi.org/10.1117/12.3010135
KEYWORDS: Extreme ultraviolet, Tin, Light sources, Inspection, Plasma, Collector mirrors, Plasma generation, Control systems, Laser irradiation, Reliability

Proceedings Article | 21 November 2023 Poster + Paper
Yasutsugu Usami, Yoshifumi Ueno, Shinji Nagai, Fumio Iwamoto, Takuya Ishii, Tsuyoshi Yamada, Hiroaki Nakarai
Proceedings Volume 12751, 1275116 (2023) https://doi.org/10.1117/12.2686231
KEYWORDS: Extreme ultraviolet, Light sources, Inspection, Tin, Extreme ultraviolet lithography, Metrology, Plasma, Collector mirrors, Pellicles, Laser irradiation

Proceedings Article | 21 November 2023 Poster + Paper
Proceedings Volume 12750, 127500V (2023) https://doi.org/10.1117/12.2686618
KEYWORDS: Extreme ultraviolet, Light sources, Inspection, Laser irradiation, Collector mirrors, Tin, Laser applications, Semiconductors, Reliability, Plasma

Proceedings Article | 28 April 2023 Poster + Paper
Proceedings Volume 12494, 1249411 (2023) https://doi.org/10.1117/12.2657640
KEYWORDS: Extreme ultraviolet, Tin, Collector mirrors, Laser irradiation, Light sources, Plasma, Ions, Gas lasers, Hydrogen, Control systems

Proceedings Article | 22 February 2021 Presentation
Proceedings Volume 11613, 116130D (2021) https://doi.org/10.1117/12.2583281
KEYWORDS: Light sources, Speckle, Yield improvement, Extreme ultraviolet lithography, Immersion lithography, Spatial coherence, Temporal coherence, Line width roughness, Optical lithography, Lithography

Showing 5 of 7 publications
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