Dr. Shankar C. Acharya
Sr. Applications Engineer at General Chemical Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 June 2003 Paper
Proceedings Volume 5038, (2003) https://doi.org/10.1117/12.488118
KEYWORDS: Deep ultraviolet, Photoresist materials, FT-IR spectroscopy, Chemistry, Photoresist processing, Lithography, Catalysis, Semiconducting wafers, Photoresist developing, Statistical analysis

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