Dr. Sergey M. Nikitin Profile

Dr. Sergey M. Nikitin

Staff System Engineer at ASML San Diego

SPIE Involvement:

Author | Instructor

Area of Expertise:

applied physics , optical sensors , system design , optical simulations , semiconductors , ZEMAX

Websites:

Personal Website

Sergey M Nikitin is an accomplished tech leader specializing in optical systems design for optical metrology, biomedical, robotics, semiconductor, and computer vision applications. With over 17 years of experience in academia, national labs (Lawrence Berkeley National Laboratory), and major companies (Amazon, ASML), he has led 20+ R&D projects, resulting in substantial cost reductions and performance improvements. Dr. Nikitin's expertise centers around optical system design, simulation, rapid prototyping, and software-hardware integration. Sergey holds a PhD in Physics with a focus on applied optics and a mini-MBA from UC Berkeley. He has received multiple prestigious awards, such as SPOT awards from LBNL, holds 3 patents, and has more than 25 publications in top journals including Nature and Science. Dr. Nikitin is a member of OPTICA, SPIE, and IEEE.

Proceedings Article | 19 September 2017 Presentation

X-ray optics laboratory at the ALS: current capabilities, new challenges, and tasks for further development (Conference Presentation)

Ian Lacey, Gary Centers, Gevork Gevorkyan, Sergey Nikitin, Brian Smith, Valeriy Yashchuk

Proceedings Volume 10385, 103850D (2017) https://doi.org/10.1117/12.2275565

KEYWORDS: X-ray optics, Metrology, Optical metrology, Interferometry, Microscopy, Calibration, Diffraction, Light sources, Data processing, Optical testing

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Proceedings Article | 7 September 2017 Presentation + Paper

Surface slope metrology of highly curved x-ray optics with an interferometric microscope

Gevork Gevorkyan, Gary Centers, Kateryna Polonska, Sergey Nikitin, Ian Lacey, Valeriy Yashchuk

Proceedings Volume 10385, 103850H (2017) https://doi.org/10.1117/12.2274220

KEYWORDS: X-ray optics, Interferometry, Metrology, Optical metrology, Calibration, Optics manufacturing, Data analysis, Microscopes

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Proceedings Article | 7 September 2017 Presentation + Paper

New twist in the optical schematic of surface slope measuring long trace profiler

Sergey Nikitin, Gevork Gevorkyan, Wayne McKinney, Ian Lacey, Peter Takacs, Valeriy Yashchuk

Proceedings Volume 10385, 103850I (2017) https://doi.org/10.1117/12.2274400

KEYWORDS: X-ray optics, Metrology, Interferometry, Prisms, Optical metrology, Free electron lasers, Diffraction, Synchrotrons, Coherent x-ray sources, X-ray sources

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Proceedings Article | 7 September 2017 Presentation + Paper

Development of a high performance surface slope measuring system for two-dimensional mapping of x-ray optics

Ian Lacey, Jérôme Adam, Gary Centers, Gevork Gevorkyan, Sergey Nikitin, Brian Smith, Valeriy Yashchuk

Proceedings Volume 10385, 103850G (2017) https://doi.org/10.1117/12.2273029

KEYWORDS: Metrology, X-ray optics, Mirrors, Nano opto mechanical systems, Calibration, Synchrotron radiation, Light sources, Diffraction, Light, Interferometry

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SPIE Journal Paper | 14 May 2012 Open Access

Temperature dependence of the optoacoustic transformation efficiency in ex vivo tissues for application in monitoring thermal therapies

Sergey Nikitin, Tatyana Khokhlova, Ivan Pelivanov

JBO, Vol. 17, Issue 6, 061214, (May 2012) https://doi.org/10.1117/12.10.1117/1.JBO.17.6.061214

KEYWORDS: Tissues, Temperature metrology, Liver, Signal detection, Absorption, Breast, Pulsed laser operation, Therapeutics, Tissue optics, Signal processing

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Proceedings Article | 28 February 2012 Paper

Optoacoustic temperature monitoring during HIFU impact on biological tissues: ex vivo study and numerical simulations of 2D temperature reconstruction

Sergey Nikitin, Tatiana Khokhlova, Ivan Pelivanov

Proceedings Volume 8223, 822313 (2012) https://doi.org/10.1117/12.909079

KEYWORDS: Tissues, Temperature metrology, Liver, Signal detection, Transducers, Absorption, Breast, Tissue optics, Signal processing, Ultrasonography

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Showing 5 of 6 publications

Course Instructor

SC1347: Design of Experiments (DOE) in Optics and Photonics

This course equips participants with the skills needed to excel in Design of Experiments (DOE) in Optics and Photonics. As technologies and applications evolve rapidly, there is a growing need for advanced methodologies to optimize design processes effectively. DOE is a powerful tool that addresses these needs by systematically identifying the best settings (input parameters) and controls for optical systems, products, and processes. More reliable and efficient than traditional methods, DOE saves time and money when creating new designs, especially in areas with little existing knowledge. By statistically analyzing a small set of well-planned experiments, DOE identifies the best inputs and controls, and helps manage processes and set limits. This course covers the basics of DOE using the Full Factorial method, with presentations, examples, and exercises.

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