Dr. Roger Artigas Pursals Profile

Dr. Roger Artigas Pursals

at Sensofar Tech SL

SPIE Involvement:

Conference Program Committee | Author

Publications (22)

Proceedings Article | 13 March 2024 Presentation

Topographic imaging of three-dimensional dynamic samples at 67 Hz

Narcís Vilar Sole, Roger Artigas, Martí Duocastella, Guillem Carles

Proceedings Volume PC12848, PC128480G (2024) https://doi.org/10.1117/12.3001005

KEYWORDS: 3D image processing, Optics manufacturing, Modulation, 3D acquisition, Quality control, Optical surfaces, Microscopy, Manufacturing, Light sources and illumination, Interferometry

Read Abstract +

Proceedings Article | 15 August 2023 Presentation + Paper

Computational self-correction of scanning nonlinearities in optical profilometry

Lena Zhukova, Roger Artigas, Guillem Carles

Proceedings Volume 12618, 126180V (2023) https://doi.org/10.1117/12.2673844

KEYWORDS: Calibration, Scanners, Control systems, Profilometers, Nonlinear optics, Computer simulations, Error analysis, Data acquisition, Confocal microscopy, Visualization

Read Abstract +

Proceedings Article | 15 August 2023 Presentation + Paper

Robust measurement of surface topography for additive manufacturing using imaging confocal microscopy

Narcís Vilar, Roger Artigas, Martí Duocastella, Guillem Carles

Proceedings Volume 12618, 126180Q (2023) https://doi.org/10.1117/12.2673818

KEYWORDS: High dynamic range imaging, Objectives, Additive manufacturing, Optical surfaces, Reflectivity, Microscopes, Confocal microscopy

Read Abstract +

Proceedings Article | 20 May 2022 Presentation + Paper

Super-resolved 3D optical profiling for surface metrology using structured illumination

Lena Zhukova, Roger Artigas, Guillem Carles

Proceedings Volume 12137, 121370F (2022) https://doi.org/10.1117/12.2621813

KEYWORDS: Spatial frequencies, Optical transfer functions, Super resolution, Digital micromirror devices, Reconstruction algorithms, 3D image reconstruction, Resolution enhancement technologies, Metrology, 3D metrology

Read Abstract +

Proceedings Article | 20 June 2021 Presentation + Paper

Metrological characterization of different methods for recovering the optically sectioned image by means of structured light

P. Martínez, C. Bermudez, G. Carles, C. Cadevall, A. Matilla, J. Marine, R. Artigas

Proceedings Volume 11782, 117820Q (2021) https://doi.org/10.1117/12.2592371

KEYWORDS: Confocal microscopy, Microscopes, Metrology, Reconstruction algorithms, Image filtering, 3D metrology

Read Abstract +

Proceedings Article | 1 April 2020 Presentation + Paper

Three-dimensional imaging confocal profiler without in-plane scanning

Pol Martínez, Carlos Bermudez, Cristina Cadevall, Aitor Matilla Ayala, Roger Artigas

Proceedings Volume 11352, 113520L (2020) https://doi.org/10.1117/12.2554716

KEYWORDS: Confocal microscopy, Microscopes, 3D metrology, 3D scanning, Interferometry, Microscopy

Read Abstract +

Most 3D metrological microscopes used today require a scanning through the optical axis, which is time consuming. The common techniques are Coherence Scanning Interferometry (CSI), Imaging Confocal Microscopy (ICM), and Focus Variation (FV). If one technique is good for smooth surfaces, it is not for rough ones, while the good for rough is too noisy for smooth ones. Additionally, high local slopes are also dependent on the scattering properties of the surface, making the Numerical Aperture of the objective the most important property of the microscope. Imaging Confocal Microscopy is the best compromise in terms of surface application range (from smooth to rough), high local slopes on shiny surfaces, highest numerical aperture and highest possible magnification. Unfortunately, any kind of Confocal microscope today (laser scan, disc scan or microdisplay scan) requires an in-plane scanning to build up the confocal image in addition to the vertical scan, increasing the total measuring time in comparison to CSI and FV. This is against the needs of quality control in production environments, where scanning speed must be as short as possible. In this paper, we use a Microdisplay Scanning Microscope for obtaining the confocal image only relying on a single image per plane. We use a structured illumination to project a desired pattern onto the surface with a very well-defined frequency and direction. By means of the Hilbert transform, we digitally shift the projected pattern one or many times to recover the bright field and the optical sectioned images. This new method reduces significantly the measurement time, simplifies the overall cost of the system and eliminates the maintenance of scanning devices, while maintaining the optical sectioning properties of each plane. We also studied the performance of the resulting topography in terms of system noise, accuracy, repeatability and fidelity of the surface using different methods to obtain the confocal image. Finally, we also compared the results with true confocal results and with other techniques that require a single image per plane, such as Active illumination Focus Variation (AiFV).

Proceedings Article | 21 June 2019 Presentation + Paper

Active illumination focus variation

Carlos Bermudez, Pol Martinez, Cristina Cadevall, Roger Artigas

Proceedings Volume 11056, 110560W (2019) https://doi.org/10.1117/12.2525981

KEYWORDS: Confocal microscopy, Microscopes, Objectives, Calibration, 3D metrology, Cameras, Stars, Optical testing, 3D image processing, Standards development

Read Abstract +

Proceedings Article | 7 November 2018 Paper

3D label free bio-transfer standards

Miikka Järvinen, Tuomas Vainikka , Tapani Viitala, Carlos Bermudez, Roger Artigas, Anton Nolvi, Pol Martinez, Niklas Sandler, Edward Hæggström, Ivan Kassamakov

Proceedings Volume 10819, 108190D (2018) https://doi.org/10.1117/12.2501258

KEYWORDS: Calibration, Standards development, 3D metrology, Solids, 3D image processing, Neodymium, Time metrology, Mirrors, 3D imaging standards, Metrology

Read Abstract +

Proceedings Article | 24 May 2018 Presentation + Paper

Residual flatness error correction in three-dimensional imaging confocal microscopes

Carlos Bermudez, André Felgner, Pol Martinez, Aitor Matilla, Cristina Cadevall, Roger Artigas

Proceedings Volume 10678, 106780M (2018) https://doi.org/10.1117/12.2306903

KEYWORDS: Microscopes, Confocal microscopy, Calibration, 3D image processing, Monochromatic aberrations, Error analysis, Cameras

Read Abstract +

Proceedings Article | 23 February 2018 Paper

Round robin test on V-shape bio-imaging transfer standard for determination of the instrument transfer function of 3D optical profilers

Carlos Bermudez, Roger Artigas, Pol Martinez, Anton Nolvi, Miikka Järvinen, Edward Hæggström, Ivan Kassamakov

Proceedings Volume 10499, 1049923 (2018) https://doi.org/10.1117/12.2289098

KEYWORDS: Calibration, Standards development, 3D metrology, Stars, Interferometers, Diffraction, Microscopes, Manufacturing, Optical transfer functions, Objectives

Read Abstract +

Proceedings Article | 26 June 2017 Paper

Automated stent defect detection and classification with a high numerical aperture optical system

Carlos Bermudez, Ferran Laguarta, Cristina Cadevall, Aitor Matilla, Sergi Ibañez, Roger Artigas

Proceedings Volume 10334, 103340C (2017) https://doi.org/10.1117/12.2275614

KEYWORDS: Line scan image sensors, Cameras, Binary data, Objectives, Optical inspection, Defect detection, Inspection, Image classification, Visualization, Microscopy, Image visualization, Process control

Read Abstract +

Proceedings Article | 26 June 2017 Paper

Confocal unrolled areal measurements of cylindrical surfaces

A. Matilla, C. Bermudez, J. Mariné, D. Martínez, C. Cadevall, R. Artigas

Proceedings Volume 10329, 1032915 (2017) https://doi.org/10.1117/12.2269631

KEYWORDS: Confocal microscopy, 3D metrology, Optical inspection, Microscopes, Interferometry, Image resolution, Calibration, Image sensors, Sensors, Time metrology, Distortion, Microscopy

Read Abstract +

Proceedings Article | 20 February 2017 Paper

Optical stent inspection of surface texture and coating thickness

Carlos Bermudez, Ferran Laguarta, Cristina Cadevall, Aitor Matilla, Sergi Ibañez, Roger Artigas

Proceedings Volume 10110, 1011007 (2017) https://doi.org/10.1117/12.2249614

KEYWORDS: Inspection, Coating, Optical inspection, 3D metrology, Reflectance spectroscopy, Microscopy, Metrology, 3D image processing, Cameras, Confocal microscopy, Interfaces, Microscopes, Interferometry, Objectives

Read Abstract +

Proceedings Article | 20 February 2017 Presentation + Paper

Round Robin test on bio-imaging transfer standard for 3D optical profilers

A. Nolvi, T. Viitala, A. García Pérez, N. Sandler, E. Hæggström, C. Bermudez, R. Artigas, I. Kassamakov

Proceedings Volume 10110, 101100M (2017) https://doi.org/10.1117/12.2250261

KEYWORDS: Photonic devices, 3D imaging standards, 3D metrology, Confocal microscopy, Phase interferometry, Interferometers, Calibration, Standards development, Optical fabrication, Optical interferometry, Objectives, Microscopes, Light sources, Mirrors

Read Abstract +

Proceedings Article | 26 April 2016 Paper

Three-dimensional measurements with a novel technique combination of confocal and focus variation with a simultaneous scan

A. Matilla, J. Mariné, J. Pérez, C. Cadevall, R. Artigas

Proceedings Volume 9890, 98900B (2016) https://doi.org/10.1117/12.2227054

KEYWORDS: 3D metrology, Imaging systems, 3D scanning, Confocal microscopy, 3D metrology, Manufacturing, Optics manufacturing, Microscopes, 3D modeling, Interferometry, Inspection, Optical testing, Astatine, Image fusion, Data fusion, Signal to noise ratio, Sensors, Cameras, Objectives, 3D image processing

Read Abstract +

Proceedings Article | 22 September 2011 Paper

Non-contact measurement of aspherical and freeform optics with a new confocal tracking profiler

Agustí Pintó, Ferran Laguarta, Roger Artigas, Cristina Cadevall

Proceedings Volume 8169, 81690V (2011) https://doi.org/10.1117/12.896724

KEYWORDS: Confocal microscopy, Freeform optics, Aspheric lenses, Metrology, Calibration, Sensors, Spherical lenses, Optics manufacturing, 3D metrology, Error analysis

Read Abstract +

Proceedings Article | 18 June 2007 Paper

Improving the measurement of thick and thin films with optical profiling techniques

Cristina Cadevall, Carles Oriach-Font, Roger Artigas, Agustí Pintó, Ferran Laguarta

Proceedings Volume 6616, 66161Z (2007) https://doi.org/10.1117/12.726187

KEYWORDS: Confocal microscopy, Semiconducting wafers, Thin films, Silicon, Objectives, Interfaces, Refractive index, Blue light emitting diodes, Light sources, Profiling

Read Abstract +

Proceedings Article | 10 September 2004 Paper

3D shape measurement of nozzles on the micrometric scale

Ferran Laguarta, Roger Artigas, Cristina Cadevall

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.545673

KEYWORDS: 3D metrology, Charge-coupled devices, Confocal microscopy, Printing, Excimer lasers, Surface finishing, Objectives, Backscatter, Profiling, Polymers

Read Abstract +

Proceedings Article | 10 September 2004 Paper

Dual-technology optical sensor head for 3D surface shape measurements on the micro- and nanoscales

Roger Artigas, Ferran Laguarta, Cristina Cadevall

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.545701

KEYWORDS: Confocal microscopy, Interferometers, Objectives, Head, 3D metrology, Profiling, Sensors, Microscopes, Inspection, Standards development

Read Abstract +

Proceedings Article | 30 May 2003 Paper

Development of confocal-based techniques for shape measurements on structured surfaces containing dissimilar materials

Cristina Cadevall, Roger Artigas, Ferran Laguarta

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.500470

KEYWORDS: Confocal microscopy, Silicon, Objectives, Interfaces, Refraction, Photoresist materials, Microscopes, Reflection, Wavefronts, Distance measurement

Read Abstract +

Proceedings Article | 21 September 1999 Paper

Three-dimensional micromeasurements on smooth and rough surfaces with a new confocal optical profiler

Roger Artigas, Agusti Pinto, Ferran Laguarta

Proceedings Volume 3824, (1999) https://doi.org/10.1117/12.364243

KEYWORDS: Confocal microscopy, Microscopes, Objectives, Charge-coupled devices, Time metrology, Metrology, Computing systems, Mirrors, Helium neon lasers, 3D image processing

Read Abstract +

Proceedings Article | 29 December 1998 Paper

Micromeasurements on smooth surfaces with a new confocal optical profiler

Ferran Laguarta, Roger Artigas, Agusti Pinto, I. Al-Khatib

Proceedings Volume 3520, (1998) https://doi.org/10.1117/12.334329

KEYWORDS: Objectives, Confocal microscopy, Microscopes, Charge-coupled devices, Prototyping, Diamond, Image processing, Mirrors, Computing systems, Metrology

Read Abstract +

Showing 5 of 22 publications

Conference Committee Involvement (1)

Optics and Photonics for Advanced Dimensional Metrology III

9 April 2024 | Strasbourg, France

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years