For the 4th generation synchrotron radiation (SR) light source, obtaining high-quality light heavily relies on the performance of the injector, which requires a high-resolution system for measuring the low-emittance and small-sized beam profile. Hence, a high-resolution beam profile measurement system for the injector of the 4th generation SR light source Hefei Advanced Light Facility (HALF) under construction is designed. This paper presents the structure of the designed beam profile measurement system, analyzes the simulation results of this system, and discusses the effect of the tilted target on the system resolution. The simulation results show that the system can achieve the resolution of 14.57 μm, the minimum resolved transverse beam size in injector is 50 μm, and the relative measurement error is only 1.12 %. The designed system provides measurements of beam profile and enhances injection efficiency for the HALF injector.
Fast measurement of the transverse beam size (bunch-by-bunch) has always been a research hotspot in the field of beam diagnosis in accelerators. A bunch-by-bunch transverse beam size system is developing at the HLS-II storage ring. The system is based on an optical imaging system and linear array multi-anode Photomultiplier tubes. A high-band-width oscilloscope is utilized to process bunch-by-bunch signal from the photodetector. In this article, the synchrotron optical imaging system, the photodetector and the signal acquisition system are introduced. According to theoretical analysis and optical system design, it is shown that this system can simultaneously measure bunch-by-bunch transverse beam size and position.
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