Prof. Nikolay G. Galkin Profile

Prof. Nikolay G. Galkin

at Institute for Automation and Control Processes

SPIE Involvement:

Author

Publications (13)

Proceedings Article | 4 January 2019 Paper

Embedding of iron silicide nanocrystals into monocrystalline silicon: suppression of emersion effect

Evgeniy Chusovitin, Dmitry Goroshko, Sergey Dotsenko, Alexander Shevlyagin, Anton Gutakovskii, Nikolay Galkin

Proceedings Volume 11024, 1102402 (2019) https://doi.org/10.1117/12.2314675

KEYWORDS: Silicon, Iron, Nanocrystals, Transmission electron microscopy, Interfaces, Solid phase epitaxy

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Proceedings Article | 4 January 2019 Paper

Laser powder fusing as an additive manufacturing process to create the ferromagnetic coatings on the basis of Fe and Sm powders on stainless steel substrate

Nikolay Galkin, Yuri Kulchin, Evgeniy Subbotin, Alexander Nikitin, Dmitrii Yatsko, Maxim Stebliy, Alexander Nepomnyaschiy

Proceedings Volume 11024, 110240Z (2019) https://doi.org/10.1117/12.2314693

KEYWORDS: Samarium, Magnetism, Iron, Chemical species, Chromium, Ferromagnetics, Nickel, Crystals, Metals, Silicon

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Proceedings Article | 13 April 2012 Paper

Approach to a creation of silicon-silicide smart materials for silicon-based thermoelectronics and photonics

N. Galkin, E. Chusovitin, K. Galkin, D. Goroshko, T. Shamirsaev

Proceedings Volume 8409, 84091W (2012) https://doi.org/10.1117/12.923310

KEYWORDS: Silicon, Nanocomposites, Nanocrystals, Iron, Electroluminescence, Semiconductors, Resistance, Doping, Magnesium, Temperature metrology

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Proceedings Article | 13 November 2007 Paper

Growth of iron films on silicon: effect of the deposition rate

A. Gouralnik, N. Galkin, V. Ivanov

Proceedings Volume 6423, 64230F (2007) https://doi.org/10.1117/12.779221

KEYWORDS: Iron, Silicon, Atomic force microscopy, Ultrafast phenomena, Magnetism, Silicon films, Chemical species, Thin films, Lithium, Capacitors

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Proceedings Article | 18 September 2007 Paper

Structural and optical properties of Si/β-FeSi2/Si heterostructures fabricated by Fe ion implantation and Si MBE

N. Galkin, E. Chusovitin, D. Goroshko, R. Bayazitov, R. Batalov, T. Shamirzaev, A. Gutakovsriy, K. Zhuravlev, A. Latyshev

Proceedings Volume 6669, 66691G (2007) https://doi.org/10.1117/12.733360

KEYWORDS: Silicon, Iron, Crystals, Annealing, Heterojunctions, Ion implantation, Ions, Atomic force microscopy, Luminescence, Reflectivity

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Proceedings Article | 8 June 2005 Paper

Formation, optical properties, and electronic structure of thin Yb silicide films on Si(111)

N. Galkin, A. Maslov, V. Polyarnyi

Proceedings Volume 5851, (2005) https://doi.org/10.1117/12.634553

KEYWORDS: Ytterbium, Thin films, Silicon, Absorption, Dielectrics, Silicon films, Chemical species, Diffusion, Annealing, Atomic force microscopy

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Proceedings Article | 8 June 2005 Paper

Iron-silicon interface formation and properties by data of DRS, SMOKE, and AFM measurements

S. Dotsenko, N. Galkin, A. Gouralnik, L. Koval, T. Turchin

Proceedings Volume 5851, (2005) https://doi.org/10.1117/12.634545

KEYWORDS: Iron, Crystals, Silicon, Atomic force microscopy, Magnetism, Dielectrics, Chemical species, Reflectance spectroscopy, Interfaces, Thin films

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Proceedings Article | 8 June 2005 Paper

B-FeSi2 cluster formation on and in silicon: morphology, electrical and optical properties

N. Galkin, D. Goroshko, V. Polyarnyi, A. Gouralnik, I. Louchaninov, V. Ole'nik, A. Novikov

Proceedings Volume 5851, (2005) https://doi.org/10.1117/12.634477

KEYWORDS: Silicon, Iron, Silicon films, Surface plasmons, Crystals, Temperature metrology, Atomic force microscopy, Scattering, Chromium, Information operations

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Proceedings Article | 8 June 2005 Paper

Optical and structural properties of monocrystalline silicon wafers modified by compression plasma flow

N. Galkin, E. Chusovitin, K. Galkin, V. Astashinskii, E. Kostyukevich, A. Kuzmitski, A. Gerasimenko

Proceedings Volume 5851, (2005) https://doi.org/10.1117/12.634533

KEYWORDS: Plasma, Silicon, Crystals, Optical properties, Magnetism, Absorption, Semiconducting wafers, X-ray diffraction, Mirrors, Atomic force microscopy

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