Prof. Motoharu Fujigaki
Professor at Univ of Fukui
SPIE Involvement:
Conference Program Committee | Author
Publications (39)

Proceedings Article | 20 September 2023 Paper
W. Jiang, M. Fujigaki
Proceedings Volume 12607, 126070B (2023) https://doi.org/10.1117/12.3005533
KEYWORDS: Mirrors, Mirror surfaces, Deflectometry, Cameras, Phase measurement, Specular reflections, Photography, Intelligence systems, Fringe analysis, Reflection

Proceedings Article | 27 October 2021 Paper
Motoharu Fujigaki, Takuya Hara
Proceedings Volume 11927, 119270I (2021) https://doi.org/10.1117/12.2616265
KEYWORDS: 3D metrology, Light emitting diodes, Fringe analysis, Light sources, Ronchi rulings, Projection systems, Projection devices, Phase shifts, Measurement devices, Photography

Proceedings Article | 27 October 2021 Paper
Wei Jiang, Takuya Hara, Motoharu Fujigaki
Proceedings Volume 11927, 119270F (2021) https://doi.org/10.1117/12.2616262
KEYWORDS: Cameras, Diffraction gratings, Phase measurement, Photography, Solids, Metals, Laser sources, Fringe analysis, Computer generated holography, Bridges

Proceedings Article | 16 October 2019 Paper
Proceedings Volume 11205, 112052F (2019) https://doi.org/10.1117/12.2541795
KEYWORDS: 3D metrology, Composites, Phase shifts, Cameras, Time metrology, Phase measurement, Projection systems, Image resolution, Calibration, Imaging systems

SPIE Journal Paper | 20 November 2018 Open Access
Motoharu Fujigaki, Hiroki Minamino, Yorinobu Murata
OE, Vol. 57, Issue 11, 114105, (November 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.11.114105
KEYWORDS: Digital holography, Phase shifts, Ferroelectric materials, Interferometry, Optical sensors, Mirrors, Head, 3D image reconstruction, Holographic interferometry, Holograms

Showing 5 of 39 publications
Conference Committee Involvement (19)
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Dimensional Optical Metrology and Inspection for Practical Applications XII
2 May 2023 | Orlando, Florida, United States
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference 2022
18 April 2022 | Yokohama, Japan
Showing 5 of 19 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top