Dr. Michael Rivera
Lead Optical Engineer
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 June 1994 Paper
Proceedings Volume 2146, (1994) https://doi.org/10.1117/12.178524
KEYWORDS: Semiconductors, Systems modeling, Diffusion, Silicon, Laser applications, Correlation function, Laser damage threshold, Laser sources, Data communications, Optical microcavities

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