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Linda Ranque
Quality Assurance Manager at EMD Electronics
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Publications (1)
Proceedings Article | 29 June 1998 Paper
Method to measure ethylene oxide/propylene oxide surfactants in resist developers
Rodica Holt, Joseph Oberlander, Maria Fides Calindas, Eleazar Gonzalez, Pilarcita Ranque
Proceedings Volume 3333, (1998) https://doi.org/10.1117/12.312456
KEYWORDS: Cobalt, Calibration, Chemical analysis, Statistical analysis, Standards development, Oxides, Liquids, Absorbance, Testing and analysis, Photoresist developing
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