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Liang Chen
at Changchun Univ of Science and Technology
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Publications (1)
Proceedings Article | 5 November 2020 Paper
Temperature rise and damage morphology of APD in external capacitor circuit irradiated by millisecond pulse laser with different pulse widths
Liang Chen, Hongxu Liu, Guangyong Jin, Di Wang, Zhi Wei
Proceedings Volume 11562, 115620J (2020) https://doi.org/10.1117/12.2576296
KEYWORDS: Avalanche photodetectors, Capacitance, Avalanche photodiodes, Silicon
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