Dr. Lenn C. Kupferberg
Principal Physicist at RTX Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 September 2003 Paper
Charles Willingham, Joseph Wahl, Patrick Hogan, Lenn Kupferberg, Thomas Wong, Alok De
Proceedings Volume 5078, (2003) https://doi.org/10.1117/12.500986
KEYWORDS: Particles, Crystals, Transparency, Ceramics, Tablets, Ultrasonics, Temperature metrology, Mid-IR, Domes, Yttrium

Proceedings Article | 26 July 1999 Paper
Yanina Kisler, Lenn Kupferberg, Gordon Mackenzie, Chia Chen
Proceedings Volume 3705, (1999) https://doi.org/10.1117/12.354636
KEYWORDS: Temperature metrology, Zinc, Sapphire, Sensors, Cameras, Black bodies, Optical filters, Data acquisition, Infrared materials, Calibration

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