Dr. Lan Wang
at Nanyang Technological Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 May 2004 Paper
Lan Wang, Siew Loong Chow, Ai Poh Loh, Zhi Ming Gong, Woei Wan Tan, Arthur Tay, Weng Khuen Ho
Proceedings Volume 5376, (2004) https://doi.org/10.1117/12.534753
KEYWORDS: Semiconducting wafers, Prototyping, Temperature metrology, Lithography, Critical dimension metrology, Computer simulations, Process modeling, Solids, Manufacturing, 3D modeling

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