Kumar R. Virwani
Graduate Assistant at Univ of Arkansas/Fayetteville
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 13 November 2002 Paper
Kumar Virwani, Ajay Malshe, W. Schmidt, Dinesh Sood
Proceedings Volume 4936, (2002) https://doi.org/10.1117/12.484272
KEYWORDS: Silicon, Etching, Laser beam diagnostics, Atomic force microscopy, Polymethylmethacrylate, Calibration, Reactive ion etching, Oxides, Crystals, Photomicroscopy

Proceedings Article | 9 November 1999 Paper
S. Lokhre, Kumar Virwani, B. Gajanan, S. Pai, Prakash Apte
Proceedings Volume 3903, (1999) https://doi.org/10.1117/12.369473

Proceedings Article | 9 November 1999 Paper
Prakash Apte, S. Lokhre, S. Purandare, B. Gajanan, Kumar Virwani
Proceedings Volume 3903, (1999) https://doi.org/10.1117/12.369464

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