Klaus Berdel
Scientific Assistant
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 1 February 2011 Open Access
Walter Michaeli, Klaus Berdel
OE, Vol. 50, Issue 02, 029802, (February 2011) https://doi.org/10.1117/12.10.1117/1.3559501
KEYWORDS: Inspection, Optical engineering

SPIE Journal Paper | 1 February 2011
Walter Michaeli, Klaus Berdel
OE, Vol. 50, Issue 02, 027205, (February 2011) https://doi.org/10.1117/12.10.1117/1.3544588
KEYWORDS: Inspection, Feature extraction, Defect detection, Image classification, Cameras, Classification systems, Image segmentation, Defect inspection, Distance measurement, Optical engineering

Proceedings Article | 17 June 2009 Paper
Walter Michaeli, Klaus Berdel, Oliver Osterbrink
Proceedings Volume 7389, 73891T (2009) https://doi.org/10.1117/12.827262
KEYWORDS: Inspection, Defect detection, Image segmentation, Optical filters, Image filtering, Polymer thin films, Polymers, Image processing, Multilayers, Cameras

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